A Single Electron Transistor (SET) fabricating employing nano-lithographical technology in a semiconductor process with processing steps comprising:
- (a):
- first depositing a sealing material in a gaseous molecular or atomic state on a top-opening of a nano cylindrical pore formed on a photo-resist layer on a substrate, so that a diameter of said top-opening gradually reduces to become a reduced nano-aperture, whose opening diameter is smaller than said diameter of said top-opening;
- (b) maintaining said substrate in a horizontal direction, and aligning an output of the sealing material which is in said gaseous molecular or atomic state to face perpendicularly towards the reduced nano-aperture so that an island electrode nano quantum dot with a same diameter as the reduced nano-aperture is directly deposited at an expected position on a surface of said substrate by means of said sealing material passing through said reduced nano-aperture;
- (c) maintaining the output of the sealing material which is in said gaseous molecular or atomic state in a same direction as before, tilting said substrate rightwards into a right tilt angle with the reduced nano-aperture as center, and and depositing a drain electrode nano quantum dot at an expected right position on said island electrode nano quantum dot on the surface of said substrate by the sealing material passing through said reduced nano-aperture again;
- (d) maintaining the output of the sealing material in said gaseous molecular or atomic state in the same direction as before, tilting said substrate leftwards into a left tilt angle with the reduced nano-aperture as center, and depositing a source electrode nano quantum dot at an expected left position of said island electrode nano quantum dot on the surface of said substrate by the sealing material passing through said reduced nano-aperture again;
- (e) maintaining the output of the sealing material in said gaseous molecular or atomic state in the same direction as before, rotating said substrate clockwise into a rotation angle in coordination with a rotated tilt angle having said reduced nano-aperture as a central axis, and depositing a gate electrode nano quantum dot at an expected front position of said existing island electrode nano quantum dot on the surface of said substrate by the sealing material passing through said reduced nano-aperture again, and
- (f) by means of solution rinsing or gas etching, removing said nano cylindrical pore in said photo-resist on said substrate, wherein a Single Electron Transistor (SET) including the island electrode nano quantum dot, the drain electrode nano quantum dot, the source electrode nano quantum dot and the gate electrode nano quantum dot with nano-scale is directly fabricated on the surface of said substrate.