# US 7,746,553 B2 · Laser scanning microscope for fluorescence testing

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- Number: US 7,746,553 B2
- Document ID: US7746553B2
- Status: Granted
- Kind: B2
- Application number: 11/878,997
- Filed: 2007-07-30
- Published: 2008-03-13
- Granted: 2010-06-29
- Earliest claimed: 2006-07-28
- Assignees: Carl Zeiss MicroImaging GmbH
- Inventors: Ralf Wolleschensky
- Web page: https://patentgrep.com/patent/US7746553B2

## CPC

- G02B 21/0076: {arrangements using fluorescence or luminescence}
- G02B: OPTICAL ELEMENTS, SYSTEMS OR APPARATUS

## Abstract

Laser scanning microscope for fluorescence testing, in which the illumination and detection rays are bound optically through a dichroic main beam splitter, the detected probe light being led to several detectors by means of a secondary beam splitter and the angle of incidence of the illumination light and/or the angle of incidence of the probe light at the splitter surface of at least the main beam splitter or at least the secondary splitter is less than 45 degrees.

## Claims

### Claim 1

A laser scanning microscope for fluorescence testing of a specimen, the laser scanning microscope comprising:
an optical axis:
means for producing illumination rays along the optical axis in the direction of the specimen;
means for producing detection rays from the specimen along the optical axis;
a dichroic main beam splitter in the optical axis for optically guiding the illumination and detection rays, the main beam splitter having a surface;
a plurality of detectors; and
means for directing the detected rays to the plurality of detectors so that the angle of incidence of the illumination rays at the surface of the main beam splitter is less than 20 degrees.

### Claim 2 (depends on 1)

The laser scanning microscope of claim 1, further comprising:
a dichroic secondary beam splitter in the optical axis for optically guiding the illumination and detection rays; and
means for directing the detected rays to the plurality of detectors so that the angle of incidence of the detected rays at the surface of secondary beam splitter is less than 45 degrees.

### Claim 3 (depends on 2)

The laser scanning microscope according to claim 2, wherein the main beam splitter shows a suppression of the illumination light of at least OD=5 and the secondary beam splitter a suppression of the illumination light of less than OD=3, wherein OD is the optical density.

### Claim 4 (depends on 2)

Laser scanning microscope according to claim 2, wherein the main beam splitter comprises a variable filter that variably changes along a gradient.

### Claim 5 (depends on 1)

The laser scanning microscope according to claim 1, wherein the main beam splitter shows a suppression of the illumination light of at least OD=5, wherein OD is the optical density.

### Claim 6 (depends on 1)

The laser scanning microscope according to claim 1, wherein the main beam splitter comprises a variable filter that variably changes along a gradient.

### Claim 7 (depends on 1)

Laser scanning microscope according to claim 1, wherein the main beam splitter comprises a variable filter that variably changes along a gradient.

### Claim 8

A laser scanning microscope for fluorescence testing of a specimen, the laser scanning microscope comprising:
an optical axis;
means for producing illumination rays along the optical axis in the direction of the specimen;
means for producing detection rays from the specimen along the optical axis;
a dichroic secondary beam splitter in the optical axis for optically guiding the illumination and detection rays;
a plurality of detectors; and
means for directing the detected rays to the plurality of detectors so that the angle of incidence of the detected rays at the surface of secondary beam splitter is less than 20 degrees.

### Claim 9 (depends on 8)

The laser scanning microscope according to claim 8, wherein the secondary beam splitter a suppression of the illumination light of less than OD=3 wherein OD is the optical density.

### Claim 10 (depends on 9)

The laser scanning microscope according to claim 9, wherein the beam splitter comprises a variable filter that variably changes along a gradient.

### Claim 11 (depends on 8)

The laser scanning microscope according to claim 8, wherein the secondary beam splitter comprises a variable filter that variably changes along a gradient.

### Claim 12 (depends on 8)

The laser scanning microscope according to claim 8, wherein the beam splitter comprises a variable filter that variably changes along a gradient.