# US 7,745,866 B2 · Semiconductor device and method for fabricating the same

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- Number: US 7,745,866 B2
- Document ID: US7745866B2
- Status: Granted
- Kind: B2
- Application number: 11/907,439
- Filed: 2007-10-12
- Published: 2008-06-19
- Granted: 2010-06-29
- Earliest claimed: 2006-12-13
- Assignees: Panasonic Corporation
- Inventors: Yoshiyuki Shibata
- Web page: https://patentgrep.com/patent/US7745866B2

## CPC

- H10B 12/312: {with a bit line higher than the capacitor}
- H10B 12/033: {the capacitor extending over the transistor}
- H10D 1/692: {Electrodes}
- H10B: ELECTRONIC MEMORY DEVICES
- H10D: INORGANIC ELECTRIC SEMICONDUCTOR DEVICES

## Abstract

A semiconductor device includes a capacitor which has: a lower electrode formed along an opening provided above a semiconductor substrate to have a concave cross section; a capacitor insulating film formed on the inner and top surfaces of the lower electrode; and an upper electrode formed on the capacitor insulating film. The upper electrode includes: a first conductive film formed on the inner surface of the capacitor insulating film and filling the opening; and a second conductive film formed to extend from the top surface of the first conductive film to the top surface of the capacitor insulating film.

## Claims

### Claim 1

A semiconductor device comprising:
a semiconductor substrate;
a transistor which includes a first impurity diffusion layer and a second impurity diffusion layer formed in the semiconductor substrate, and a gate electrode formed above a region of the semiconductor substrate located between the first and second impurity diffusion layers as seen from a horizontal plane;
a first interlayer insulating film formed on the semiconductor substrate and the gate electrode;
a contact plug formed on the first impurity diffusion layer of the semiconductor substrate and penetrating the first interlayer insulating film;
a second interlayer insulating film formed over the first interlayer insulating film and having an opening formed in a region thereof located above the contact plug; and
a capacitor which includes a lower electrode formed on the contact plug, a capacitor insulating film formed on the inner and top surfaces of the lower electrode, and an upper electrode formed on the capacitor insulating film, the lower electrode being formed along the inner surface of the opening to have a concave cross section, the lower electrode being electrically connected to the first impurity diffusion layer,
wherein the upper electrode includes: a first conductive film formed on the inner surface of the capacitor insulating film and formed only in the opening; and a second conductive film formed to extend from the top surface of the first conductive film to the top surface of the capacitor insulating film, and
the top surface of the lower electrode is substantially flush with the top surface of the second interlayer insulating film.

### Claim 2 (depends on 1)

The device of claim 1, wherein the second conductive film has a smaller thickness than the first conductive film.

### Claim 3 (depends on 1)

The device of claim 1, wherein the second conductive film is made of a different material from the first conductive film.

### Claim 4 (depends on 3)

The device of claim 3, wherein the first conductive film is made of titanium nitride, and the second conductive film is made of tungsten nitride.

### Claim 5 (depends on 1)

The device of claim 1, wherein the second conductive film has a thickness of 5 to 30 nm inclusive.

### Claim 6 (depends on 1)

The device of claim 1, wherein the first conductive film has a thickness of 10 to 200 nm inclusive.

### Claim 7 (depends on 1)

The device of claim 1, wherein the lower electrode and the upper electrode are made of titanium nitride.

### Claim 8 (depends on 1)

The device of claim 1, wherein the capacitor insulating film is made of metal oxide.

### Claim 9 (depends on 8)

The device of claim 8, wherein the capacitor insulating film is made of hafnium oxide.

### Claim 10 (depends on 8)

The device of claim 8, wherein the capacitor insulating film is made of tantalum oxide.

### Claim 11 (depends on 8)

The device of claim 8, wherein the capacitor insulating film is made of zirconium oxide.

### Claim 12 (depends on 8)

The device of claim 8, wherein the capacitor insulating film is made of niobium oxide.

### Claim 13 (depends on 8)

The device of claim 8, wherein the capacitor insulating film is made of aluminum oxide.

### Claim 14 (depends on 8)

The device of claim 8, wherein the capacitor insulating film is a stacked film made of at least any two of hafnium oxide, tantalum oxide, zirconium oxide, niobium oxide and aluminum oxide.

### Claim 15 (depends on 1)

The device of claim 1, wherein the first conductive film fills up the opening.

### Claim 16 (depends on 1)

The device of claim 1, wherein the lower electrode is made of tungsten nitride.

### Claim 17 (depends on 1)

The device of claim 1, wherein the lower electrode is made of ruthenium oxide.

### Claim 18 (depends on 1)

The device of claim 1, wherein the lower electrode is made of platinum.

### Claim 19 (depends on 1)

The device of claim 1, wherein the lower electrode is made of titanium silicon nitride.

### Claim 20 (depends on 1)

The device of claim 1, wherein the lower electrode is a stacked film made of at least any two of titanium nitride, tungsten nitride, ruthenium nitride, platinum and titanium silicon nitride.