# US 7,743,648 B1 · Spin microscope based on optically detected magnetic resonance

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- Number: US 7,743,648 B1
- Document ID: US7743648B1
- Status: Granted
- Kind: B1
- Application number: 11/845,982
- Filed: 2007-08-28
- Granted: 2010-06-29
- Earliest claimed: 2007-08-28
- Assignees: The United States of America as represented by the United States Department of Energy
- Inventors: Gennady P. Berman; Boris M. Chernobrod
- Web page: https://patentgrep.com/patent/US7743648B1

## CPC

- G01N 24/10: by using electron paramagnetic resonance (G01N24/12 takes precedence)
- B82Y 35/00: Methods or apparatus for measurement or analysis of nanostructures
- G01Q 20/02: by optical means
- G01Q 60/08: MFM [Magnetic Force Microscopy] combined with AFM [Atomic Force Microscopy
- G01Q 60/52: Resonance
- G01R 33/60: using electron paramagnetic resonance (G01R33/24, G01R33/62 take precedence)
- G01R 33/323: {Detection of MR without the use of RF or microwaves, e.g. force-detected MR, thermally detected MR, MR detection via electrical conductivity, optically detected MR}
- G01R 33/4808: {Multimodal MR, e.g. MR combined with positron emission tomography [PET], MR combined with ultrasound or MR combined with computed tomography [CT]}
- G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing apparatus or processes other than immunoassay, involving enzymes or microorganisms C12M, C12Q)
- B82Y: SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- G01Q: SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12)

## Abstract

The invention relates to scanning magnetic microscope which has a photoluminescent nanoprobe implanted in the tip apex of an atomic force microscope (AFM), a scanning tunneling microscope (STM) or a near-field scanning optical microscope (NSOM) and exhibits optically detected magnetic resonance (ODMR) in the vicinity of unpaired electron spins or nuclear magnetic moments in the sample material. The described spin microscope has demonstrated nanoscale lateral resolution and single spin sensitivity for the AFM and STM embodiments.

## Claims

### Claim 1

A scanning magnetic microscope comprising:
an ultrasensitive micro-cantilever onto the free end of which is fixed a photoluminescent material which exhibits an optically detectable magnetic resonance;
a sample of dilute paramagnetic particles exhibiting electron spins which is closely positioned, in the range of tens of nanometers, to said photoluminescent material;
a permanent magnet placed nearby for inducing an external magnetic field upon said photoluminescent material and said sample of dilute paramagnetic particles;
a radio frequency coil placed nearby for inducing an external radio frequency field upon said photoluminescent material and said sample of dilute paramagnetic particles;
an optical fiber placed in close proximity to said photoluminescent material for introducing an evanescent laser exciting light upon said photoluminescent material at a frequency resonant with the transition between the magnetic sublevels of said photoluminescent material; and
a detector, positioned at a 45 degree angle to said photoluminescent material and said sample of dilute paramagnetic particles in both plan and elevation views, capable of optically recognizing the photoluminescent intensity of transition emissions given off by said photoluminescent material when excited.