Dynamically reconfigurable shared scan-in test architecture
AssigneeSynopsys, Inc.
InventorsRohit Kapur, Nodari Sitchinava, Samitha Samaranayake, Emil Gizdarski, Frederic J. Neuveux, Suryanarayana Duggirala, Thomas W. Williams
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Abstract
A low overhead dynamically reconfigurable shared scan-in test architecture is provided. This test architecture advantageously allows for changing scan inputs during the scan operation on a per shift basis. The flexibility of reconfiguring the scan input to scan chain mapping every shift cycle can advantageously reduce both test data volume and test application time.
Claims5
A dynamically reconfigurable shared scan-in test architecture for a test design, the architecture comprising:
- a plurality of scan chains formed from the test design;
- a plurality of multiplexers, each multiplexer selectively providing an output to multiple scan chains, wherein the plurality of multiplexers provide a per scan-in shift reconfigurability;
- wherein each multiplexer selectively couples a scan input to a plurality of scan chains;
- and
- wherein different scan chains form the plurality of scan chains for each configuration.
A dynamically reconfigurable shared scan-in test architecture for a test design, the architecture comprising:
- a plurality of scan chains formed from the test design;
- multiplexing means for, on a per shift basis, selectively connecting each scan input to multiple scan chains;
- and
- a control unit providing control inputs to the multiplexing means, wherein the control unit generates multiple shift cycles of the multiplexing means during a scan.
Dependencies are inferred from the claim text.