Identifying process and temperature of silicon chips
AssigneeQUALCOMM Incorporated
InventorsJagrut Viliskumar Patel, Martin Vyungchon Choe, Ziad Mansour
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Abstract
Systems and techniques are disclosed relating to communications. The systems and techniques include determining the temperature and process speed of chips used in communications devices. The systems and techniques include measuring the output of ring oscillators embedded in the chips, and calculating the temperature and process speed therefrom.
Claims22
A method for determining an operating parameter of a chip having first and second ring oscillators, comprising:
- measuring a frequency of the first ring oscillator;
- measuring a frequency of the second ring oscillator;
- multiplying, by a processor, the measured frequency of the first ring oscillator by the measured frequency of the second ring oscillator to obtain a result;
- and
- determining, by the processor, as a function of the result and characterization data of the chip, the chip's actual temperature.
A computer-readable storage medium embodying a program of instructions executable by a computer to determine an operating parameter of a chip having first and second ring oscillators, the executable instructions for:
- measuring a frequency of the first ring oscillator;
- measuring a frequency of the second ring oscillator;
- multiplying the measured frequency of the first ring oscillator by the measured frequency of the second ring oscillator to obtain a result;
- and
- determining, as a function of the result and characterization data of the chip, the chip's temperature.
A system comprising:
- a chip having first and second ring oscillators;
- and
- a processor configured to:
- measure a frequency of the first ring oscillator;
- measure a frequency of the second ring oscillator;
- multiply the measured frequency of the first ring oscillator by the measured frequency of the second ring oscillator to obtain a result;
- and
- determine, as a function of the result and characterization data of the chip, the chip's actual temperature.
A processor comprising:
- means for measuring a frequency of a first ring oscillator;
- means for measuring a frequency of the second ring oscillator;
- means for multiplying the measured frequency of the first ring oscillator by the measured frequency of the second ring oscillator to obtain a result;
- and
- means for determining, as a function of the result and characterization data of the chip, the chip's temperature.
A method for determining a process speed of the chip in response to the actual temperature, having first and second ring oscillators, comprising:
- measuring a frequency of the first ring oscillator;
- measuring a frequency of the second ring oscillator;
- dividing, by a processor, the measured frequency of the first ring oscillator frequency by the measured frequency of the second ring oscillator to obtain a result;
- and
- determining, by the processor, as a function of the division result and characterization data of the chip, the chip's process speed.
A computer-readable storage medium embodying a program of instructions executable by a computer to determine a process speed of the chip in response to the actual temperature, having first and second ring oscillators, the executable instructions for:
- measuring a frequency of the first ring oscillator;
- measuring a frequency of the second ring oscillator;
- dividing the measured frequency of the first ring oscillator frequency by the measured frequency of the second ring oscillator to obtain a result;
- and
- determining, as a function of the result and characterization data of the chip, the chip's process speed.
A system configured to determine a process speed of the chip in response to the actual temperature, comprising:
- a chip having first and second ring oscillators;
- and
- a processor configured to:
- measure a frequency of the first ring oscillator;
- measure a frequency of the second ring oscillator;
- divide the measured frequency of the first ring oscillator frequency by the measured frequency of the second ring oscillator to obtain a result;
- and
- determine, as a function of the result and characterization data of the chip, the chip's process speed.
Dependencies are inferred from the claim text.