Automatic IIP2 calibration architecture

A method for on-chip generation of an radio frequency (RF) test signal having a second order tone, comprising:

• a) generating a base frequency signal from a native circuit;
• b) generating an offset signal corresponding to the second order tone with a test circuit, the offset signal being a preset digital test signal;
• c) converting the offset signal into an analog signal;
• and,
• d) mixing the base frequency signal with the offset signal to generate the RF test signal by a native transmit path circuit.

A method for second order intermodulation (IIP2) testing and calibration of a wireless device, comprising:

• a) detecting a calibration event;
• b) generating a radio frequency (RF) test signal having a second order tone with native circuits of the wireless device by;
• i) generating a base frequency signal by enabling a transmit clock generator circuit;
• ii) generating a preset digital test signal corresponding to the second order tone with a test circuit;
• iii) converting a preset digital test signal into an analog signal that corresponds to an offset signal;
• and,
• iv) mixing the base frequency signal with the offset signal by a native transmit path circuit to generate the RF test signal;
• c) propagating the RF test signal through a receive path of the wireless device;
• d) measuring a parameter of the second order tone and generating a corresponding compensation signal;
• and
• e) adjusting one or more circuits of the receive path with the compensation signal for minimizing the second order tone.