Systems and methods for detecting an image of an object by use of an X-ray beam having a polychromatic distribution

A system for detecting an image of an object, the system comprising:

• (a) a non-synchrotron X-ray source configured to generate a first divergent X-ray beam having a polychromatic energy distribution and characteristic lines Kα1 and Kα2 with X-ray energies above 40 keV;
• (b) a single monochromator crystal positioned in a predetermined position to directly intercept the first X-ray beam to select and produce a second divergent X-ray beam having a predetermined energy level for transmission through an object, the second x-ray beam containing a narrow energy band including characteristic lines Kα1 and Kα2 with X-ray energies above 40 keV;
• (c) an analyzer crystal positioned to intercept a transmitted X-ray beam at an angle of incidence of the analyzer crystal;
• and
• (d) an image detector configured to detect an image of an object from a beam diffracted from the analyzer crystal.

A method for detecting an image of an object, the method comprising:

• (a) generating a first divergent X-ray beam having a polychromatic energy distribution and characteristic lines Kα1 and Kα2 with X-ray energies above 40 keV by generating a plurality of X-ray beams fanning out in different directions from a non-synchrotron X-ray point source;
• (b) positioning a monochromator crystal in a predetermined position to intercept the first X-ray beam and select and produce a second divergent X-ray beam having a predetermined energy level, the second x-ray beam containing a narrow energy band including characteristic lines Kα1 and Kα2 with X-ray enemies above 40 keV;
• (c) positioning an object in a path of the second X-ray beam for transmission of the second X-ray beam through the object and emitting from the object a transmitted X-ray beam;
• (d) directing the transmitted X-ray beam at an angle of incidence upon an analyzer crystal;
• and
• (e) detecting an image of the object from a beam diffracted from the analyzer crystal.

A system for detecting an image of an object, the system comprising:

• (a) an X-ray tube configured to generate a first divergent X-ray beam having a polychromatic energy distribution and characteristic lines Kα1 and Kα2 with X-ray energies above 40 keV by generating a plurality of X-ray beams fanning out in different directions from an X-ray point source of the X-ray tube;
• (b) a monochromator crystal positioned in a predetermined position to intercept the first X-ray beam and select and produce a second divergent X-ray beam having a predetermined energy level for transmission through an object, the second x-ray beam containing a narrow energy band including characteristic lines Kα1 and Kα2 with X-ray energies above 40 keV;
• (c) an analyzer crystal positioned to intercept a transmitted X-ray beam at an angle of incidence of the analyzer crystal;
• and
• (d) an image detector configured to detect an image of an object from a beam diffracted from the analyzer crystal.

A method for detecting an image of an object, the method comprising:

• (a) generating a first divergent X-ray beam from a non-synchrotron X-ray source, the first X-ray beam having first and second characteristic emission lines Kα1 and Kα2 with X-ray energies above 40 keV;
• (b) positioning a monochromator crystal in a predetermined position to intercept the first X-ray beam and select and produce a second divergent X-ray beam having the first and second characteristic emission lines;
• (c) selectively blocking one of the first and second characteristic emission lines of the second X-ray beam and allowing an unblocked one of the first and second characteristic emission lines of the second X-ray beam to pass;
• (d) positioning an object in a path of the unblocked one of the first and second characteristic emission lines of the second X-ray beam for transmission of the unblocked characteristic line of the second X-ray beam through the object and emitting from the object a transmitted X-ray beam;
• (e) directing the transmitted X-ray beam at an angle of incidence upon an analyzer crystal;
• and
• (f) detecting an image of the object from a beam diffracted from the analyzer crystal.

A system for detecting an image of an object, the system comprising:

• (a) a non-synchrotron X-ray source configured to generate a first divergent X-ray beam having first and second characteristic emission lines Kα1 and Kα2 with X-ray energies above 40 keV;
• (b) a monochromator crystal positioned in a predetermined position to intercept the first X-ray beam such that a second divergent X-ray beam having the first and second characteristic emission lines is selected and produced;
• (c) a collimator having a slit adjustable for selectively blocking one of the first and second characteristic emission lines of the second X-ray beam and allowing an unblocked one of the first and second characteristic emission lines of the second X-ray beam to pass for transmission through an object;
• (d) an analyzer crystal positioned to intercept a transmitted X-ray beam at an angle of incidence of the analyzer crystal;
• and
• (e) an image detector configured to detect an image of an object from a beam diffracted from the analyzer crystal.

A method for detecting an image of an object, the method comprising:

• (a) generating a first divergent X-ray beam from a non-synchrotron X-ray source, the first X-ray beam having first and second characteristic emission lines Kα1 and Kα2 with X-ray energies above 40 keV;
• (b) positioning a monochromator crystal in a predetermined position to intercept the first X-ray beam and select and produce a second divergent X-ray beam having the first and second characteristic emission lines;
• (c) positioning an object in a path of the first and second characteristic emission lines of the second X-ray beam for transmission of the first and second characteristic emission lines of the second X-ray beam through the object and emitting from the object a transmitted X-ray beam;
• (d) directing the transmitted X-ray beam at an angle of incidence upon an analyzer crystal;
• and
• (e) detecting an image of the object from a beam diffracted from the analyzer crystal.

A system for detecting an image of an object, the system comprising:

• (a) a non-synchrotron X-ray source configured to generate a first divergent X-ray beam having first and second characteristic emission lines Kα1 and Kα2 with X-ray energies above 40 keV;
• (b) a monochromator crystal positioned in a predetermined position to intercept the first X-ray beam such that a second divergent X-ray beam having the first and second characteristic emission lines is selected and produced for transmission through an object;
• (c) an analyzer crystal positioned to intercept a transmitted X-ray beam at an angle of incidence of the analyzer crystal;
• and
• (d) an image detector configured to detect an image of an object from a beam diffracted from the analyzer crystal.