Rd algorithm improvement for NROM technology
AssigneeSaifun Semiconductors Ltd.
InventorsArik Rizel, Guy Cohen
Life of this patent
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AssigneeSaifun Semiconductors Ltd.
InventorsArik Rizel, Guy Cohen
Estimating the term…
Selecting a read voltage level for a NVM cell by using an initial value for the read voltage and performing a read operation, comparing an actual number of bits found to an expected number of bits and, if there is a discrepancy between the actual number and the expected number, adjusting the read voltage level, based on variable data such as statistics available, level occupation, neighbor level, previous chunks data, and other data used during read, program or erase. For example, based on a number of missing bits, or upon a result of a previous read operation, or a result obtained at another program level, or upon how many times the memory cell has been cycled, or upon how many memory cells are at each program level, or on a number of bits at another program level in a selected chunk of memory.
A method of selecting a read voltage level for reading a non-volatile memory (NVM) cell comprising:
Dependencies are inferred from the claim text.