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US 7,741,863 B2Granted
Apparatus and methods for performing a test
AssigneeInfineon Technologies AG
InventorJohann Peter Forstner
Life of this patent
Estimating the term…
Abstract
A circuit structure has a circuit portion with negative resistance and a test resonator structure. Furthermore, the circuit structure has a unit for coupling the test resonator structure to the circuit portion with negative resistance during testing and for decoupling the test resonator structure from the circuit portion with negative resistance after testing.
Claims8
A test method for performing a circuit test, comprising:
- providing a test oscillator comprising a test resonator structure, and coupling a circuit portion with negative resistance to the test resonator structure;
- performing a test using the test oscillator;
- decoupling the test resonator structure from the circuit portion with negative resistance,
- wherein the decoupling comprises cutting a substrate portion associated with the test resonator and the circuit portion, wherein the cutting breaks a conductor portion therebetween, or breaking a fuse structure between the test resonator and the circuit portion.
1 more element
A test method for performing a circuit test, comprising:
- providing a test oscillator comprising a test resonator structure, and coupling a circuit portion with negative resistance to the test resonator structure;
- performing a test using the test oscillator;
- decoupling the test resonator structure from the circuit portion with negative resistance, wherein performing the test further comprises:
- coupling out a signal portion from the test resonator structure by means of a signal outcoupling unit;
- mixing an output signal of the test oscillator with a phase-shifted version of the coupled out signal portion via a mixer to form a mixed signal;
- and
- measuring a DC signal portion of the mixed signal.
4 more elements
Dependencies are inferred from the claim text.