Photodiode having increased proportion of light-sensitive area to light-insensitive area

A method of manufacturing a photodiode having an increased proportion of light-sensitive area to light-insensitive area, the method comprising:

• providing a semiconductor having a frontside surface and a backside surface and including:
• a first active layer having a first conductivity,
• a second active layer having a second conductivity opposite the first conductivity, and
• an intrinsic layer separating the first and second active layers;
• forming isolation trenches arranged to divide the photodiode into a plurality of cells, wherein the isolation trenches have a depth to width ratio of at least 5.0;
• forming a via in each cell, wherein each via has a length to diameter ratio of at least 7.0;
• and
• forming a frontside electrical contact for each cell in electrical communication with the second active layer and the via, each cell having a total frontside area including a cell active frontside area sensitive to light and a cell inactive frontside area not sensitive to light, and the cell active frontside area forming at least 95 percent of the cell total frontside area.