Display panel, display panel inspection method, and display panel manufacturing method

A method of inspecting a display panel in a manufacturing process of said display panel comprising a plurality of pixels each comprising a wiring, a thin film transistor, and a pixel electrode, said method comprising steps of:

• making said thin film transistor in an on state by controlling an electric potential of said wiring before forming said pixel electrode by patterning a conductive film;
• measuring a value of electric current flowing in said conductive film;
• and
• judging whether or not said thin film transistor and said wiring are defective from said value,
• wherein said steps are performed to all of said plurality of pixels in order.

A method of inspecting a display panel in a manufacturing process of said display panel comprising a plurality of pixels each comprising a switching thin film transistor, an EL driver thin film transistor, a source signal line, a gate signal line, a power source supply line, and a pixel electrode electrically connected to said EL driver thin film transistor, said method comprising steps of:

• making said switching thin film transistor in an on state by controlling an electric potential of said gate signal line, making said EL driver thin film transistor in an on state by controlling an electric potential of said source signal line, and controlling an electric potential of said power source supply line, before forming said pixel electrode by patterning a conductive film;
• measuring a value of electric current flowing in said conductive film;
• and
• judging whether or not said switching thin film transistor, said EL driver thin film transistor, said source signal line, said gate signal line, said power source supply line are defective from said value,
• wherein said steps are performed to all of said plurality of pixels in order.

A method of inspecting a display panel in a manufacturing process of said display panel comprising a plurality of pixels each comprising a switching thin film transistor, an EL driver thin film transistor, a source signal line, a gate signal line, a power source supply line, and a pixel electrode connected to a drain region of said EL driver thin film transistor, said method comprising steps of:

• making said switching thin film transistor in an on state by controlling an electric potential of said gate signal line, making said EL driver thin film transistor in an on state by controlling an electric potential of said source signal line, and controlling an electric potential of said power source supply line, before forming said pixel electrode by patterning a conductive film;
• measuring a value of electric current flowing in said conductive film;
• and
• judging whether or not said switching thin film transistor, said EL driver thin film transistor, said source signal line, said gate signal line, said power source supply line are defective from said value,
• wherein said steps are performed to all of said plurality of pixels in order.

A method of inspecting a display panel in a manufacturing process of said display panel comprising a plurality of pixels each comprising a first switching thin film transistor, a second switching thin film transistor, an EL driver thin film transistor, a source signal line, a first gate signal line, a second gate signal line, a power source supply line, and a pixel electrode electrically connected to said EL driver thin film transistor, said method comprising steps of:

• making said first switching thin film transistor in an on state by controlling an electric potential of said first gate signal line, making said EL driver thin film transistor in an on state by controlling an electric potential of said source signal line, and controlling an electric potential of said power source supply line, before forming said pixel electrode by patterning a conductive film;
• measuring a first value of electric current flowing in said conductive film;
• making said second switching thin film transistor in an on state by controlling an electric potential of said second gate signal, line and making said EL driver thin film transistor in an off state, before forming said pixel electrode by patterning the conductive film;
• measuring a second value of electric current flowing in said conductive film;
• judging whether or not said first switching thin film transistor, said second switching thin film transistor, said EL driver thin film transistor, said source signal line, said first gate signal line, said second gate signal line, and said power source supply line are defective from said first value and said second value,
• wherein said steps are performed to all of said plurality of pixels in order.

A method of inspecting a display panel in a manufacturing process of said display panel comprising a plurality of pixels each comprising a first switching thin film transistor, a second switching thin film transistor, an EL driver thin film transistor, a source signal line, a first gate signal line, a second gate signal line, a power source supply line, and a pixel electrode connected to a drain region said EL driver thin film transistor, said method comprising steps of:

• making said first switching thin film transistor in an on state by controlling an electric potential of said first gate signal line, making said EL driver thin film transistor in an on state by controlling an electric potential of said source signal line, and controlling an electric potential of said power source supply line, before forming said pixel electrode by patterning a conductive film;
• measuring a first value of electric current flowing in said conductive film;
• making said second switching thin film transistor in an on state by controlling an electric potential of said second gate signal line and making said EL driver thin film transistor in an off state, before forming said pixel electrode by patterning the conductive film;
• measuring a second value of electric current flowing in said conductive film;
• judging whether or not said first switching thin film transistor, said second switching thin film transistor, said EL driver thin film transistor, said source signal line, said first gate signal line, said second gate signal line, and said power source supply line are defective from said first value and said second value,
• wherein said steps are performed to all of said plurality of pixels in order.

A method of inspecting a display panel in a manufacturing process of said display panel comprising a plurality of pixels each comprising a thin film transistor and a pixel electrode electrically connected to said thin film transistor, said method comprising steps of:

• connecting all the pixel electrodes of said plurality of pixels electrically by an inspection conductive film;
• making said thin film transistor in an on state;
• measuring a value of electric current flowing in said inspection conductive film;
• judging whether or not said thin film transistor is defective from said value;
• and
• removing said inspection conductive film after said judging is performed to all of said plurality of pixels in order.

A method of inspecting a display panel in a manufacturing process of said display panel comprising a plurality of pixels each comprising a wiring, a thin film transistor and a pixel electrode electrically connected to said thin film transistor, said method comprising steps of:

• connecting all the pixel electrodes of said plurality of pixels electrically by an inspection conductive film;
• making said thin film transistor in an on state by controlling an electric potential of said wiring;
• measuring a value of electric current flowing in said inspection conductive film;
• judging whether or not said wiring and said thin film transistor is defective from said value;
• and
• removing said inspection conductive film after said judging is performed to all of said plurality of pixels in order.

A method of inspecting a display panel in a manufacturing process of said display panel comprising a plurality of pixels each comprising a switching thin film transistor, an EL driver thin film transistor, a source signal line, a gate signal line, a power source supply line, and a pixel electrode electrically connected to said EL driver thin film transistor, said method comprising steps of:

• connecting all the pixel electrodes of said plurality of pixels electrically by an inspection conductive film;
• making said switching thin film transistor in an on state by controlling an electric potential of said gate signal line, making said EL driver thin film transistor in an on state by controlling an electric potential of said source signal line, and controlling an electric potential of said power source supply line;
• measuring a value of electric current flowing in said inspection conductive film;
• judging whether or not said switching thin film transistor, said EL driver thin film transistor, said source signal line, said gate signal line, said power source supply line are defective from said value;
• and
• removing said inspection conductive film after said judging is performed to all of said plurality of pixels in order.

A method of inspecting a display panel in a manufacturing process of said display panel comprising a plurality of pixels each comprising a switching thin film transistor, an EL driver thin film transistor, a source signal line, a gate signal line, a power source supply line, and a pixel electrode connected to a drain region of said EL driver thin film transistor, said method comprising steps of:

• connecting all the pixel electrodes of said plurality of pixels electrically by an inspection conductive film;
• making said switching thin film transistor in an on state by controlling an electric potential of said gate signal line, making said EL driver thin film transistor in an on state by controlling an electric potential of said source signal line, and controlling an electric potential of said power source supply line;
• measuring a value of electric current flowing in said inspection conductive film;
• judging whether or not said switching thin film transistor, said EL driver thin film transistor, said source signal line, said gate signal line, said power source supply line are defective from said value;
• and
• removing said inspection conductive film after said judging is performed to all of said plurality of pixels in order.

A method of inspecting a display panel in a manufacturing process of said display panel comprising a plurality of pixels each comprising a first switching thin film transistor, a second switching thin film transistor, an EL driver thin film transistor, a source signal line, a first gate signal line, a second gate signal line, a power source supply line, and a pixel electrode electrically connected to said EL driver thin film transistor, said method comprising steps of:

• connecting all the pixel electrodes of said plurality of pixels electrically by an inspection conductive film;
• making said first switching thin film transistor in an on state by controlling an electric potential of said first gate signal line, making said EL driver thin film transistor in an on state by controlling an electric potential of said source signal line, and controlling an electric potential of said power source supply line;
• measuring a first value of electric current flowing in said inspection conductive film;
• making said second switching thin film transistor in an on state by controlling an electric potential of said second gate signal line and making said EL driver thin film transistor in an off state;
• measuring a second value of electric current flowing in said inspection conductive film;
• judging whether or not said first switching thin film transistor, said second switching thin film transistor, said EL driver thin film transistor, said source signal line, said first gate signal line, said second gate signal line, and said power source supply line are defective from said first value and said second value,
• removing said inspection conductive film after said judging is performed to all of said plurality of pixels in order.

A method of inspecting a display panel in a manufacturing process of said display panel comprising a plurality of pixels each comprising a first switching thin film transistor, a second switching thin film transistor, an EL driver thin film transistor, a source signal line, a first gate signal line, a second gate signal line, a power source supply line, and a pixel electrode connected to a drain region of said EL driver thin film transistor, said method comprising steps of:

• connecting all the pixel electrodes of said plurality of pixels electrically by an inspection conductive film;
• making said first switching thin film transistor in an on state by controlling an electric potential of said first gate signal line, making said EL driver thin film transistor in an on state by controlling an electric potential of said source signal line, and controlling an electric potential of said power source supply line;
• measuring a first value of electric current flowing in said inspection conductive film;
• making said second switching thin film transistor in an on state by controlling an electric potential of said second gate signal line and making said EL driver thin film transistor in an off state;
• measuring a second value of electric current flowing in said inspection conductive film;
• judging whether or not said first switching thin film transistor, said second switching thin film transistor, said EL driver thin film transistor, said source signal line, said first gate signal line, said second gate signal line, and said power source supply line are defective from said first value and said second value,
• removing said inspection conductive film after said judging is performed to all of said plurality of pixels in order.