Diagnostic analytical method utilizing DNA chips with thin-film transistor (TFT) elements
AssigneeSeiko Epson Corporation
InventorsHisashi Aruga, Tatsuya Shimoda
Life of this patent
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AssigneeSeiko Epson Corporation
InventorsHisashi Aruga, Tatsuya Shimoda
Estimating the term…
An IJ-system reagent inspection device 3 that instructs an ejection device to eject a reagent and reads an inspection result from a detachable DNA chip module 2. The method is carried out based on inspection information of inputted inspection items to produce and output inspection data along with inputted examinee-identification information and the corresponding inspection items through communication lines. In a control device 5, the examinee identification information is received from the IJ-system reagent inspection device 3 along with the inspection items and the inspection data through the communication lines. The inspection items and the inspection data are recorded in association with the examinee identification information to request a diagnosis based on the inspection data.
A control method comprising the steps of:
A computer readable storage medium including a control program comprising the processes for causing a computer to execute:
Dependencies are inferred from the claim text.