Simultaneous front side ash and backside clean
AssigneeNovellus Systems, Inc.
InventorsHaruhiro H Goto, David Cheung
Life of this patent
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AssigneeNovellus Systems, Inc.
InventorsHaruhiro H Goto, David Cheung
Estimating the term…
A method and apparatus for cleaning a wafer. The wafer is heated and moved to a processing station within the apparatus that has a platen either permanently in a platen down position or is transferable from a platen up position to the platen down position. The wafer is positioned over the platen so as not to contact the platen and provide a gap between the platen and wafer. The gap may be generated by positioning the platen in a platen down position. A plasma flows into the gap to enable the simultaneous removal of material from the wafer front side, backside and edges. The apparatus may include a single processing station having the gap residing therein, or the apparatus may include a plurality of processing stations, each capable of forming the gap therein for simultaneously removing additional material from the wafer front side, backside and edges.
A method for removing material from a work piece comprising:
A method for removing material from a work piece comprising:
An apparatus for removing material from a work piece comprising:
Dependencies are inferred from the claim text.