Probe system comprising an electric-field-aligned probe tip and method for fabricating the same
AssigneeThe Regents of the University of California
InventorsSungho Jin, Li-Han Chen, I-Chen Chen
Life of this patent
Estimating the term…
Loading patent…
AssigneeThe Regents of the University of California
InventorsSungho Jin, Li-Han Chen, I-Chen Chen
Estimating the term…
A mechanically stable and oriented scanning probe tip comprising a carbon nanotube having a base with gradually decreasing diameter, with a sharp tip at the probe tip. Such a tip or an array of tips is produced by depositing a catalyst metal film on a substrate (10 & 12 in FIG. 1(a)), depositing a carbon dot (14 in FIG. 1(b)) on the catalyst metal film, etching away the catalyst metal film (FIG. 1(c)) not masked by the carbon dot, removing the carbon dot from the catalyst metal film to expose the catalyst metal film (FIG. 1(d)), and growing a carbon nanotube probe tip on the catalyst film (16 in FIG. 1(e)). The carbon probe tips can be straight, angled, or sharply bent and have various technical applications.
A mechanically stable carbon nanotube, having a scanning probe tip comprising an oriented carbon nanotube having a carbon-island-defined base with a gradually decreasing diameter, with a sharp point at the probe tip.
The carbon nanotube probe of clam 1 wherein the surface of the probe tip is coated with an electrically insulating layer, except for the tip region.
Dependencies are inferred from the claim text.