Method for puncturing a low density parity check code
AssigneesSamsung Electronics Co., Ltd., Yonsei University
InventorsDong-Ho Kim, Yung-Soo Kim, Ye-Hoon Lee, Myeon-Gyun Cho, Hyo-Yol Park, Keum-Chan Whang, Kwang-Soon Kim, Jae-Won Kang
Life of this patent
Estimating the term…