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US 7,734,848 B2Granted
System and method for frequency offset testing
AssigneeVerigy (Singapore) Pte. Ltd.
InventorJinlei Liu
Life of this patent
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Abstract
Described is a system and method for frequency offset testing. The system comprises an electronic device, a first testing device providing a reference clock signal at a first frequency to the electronic device, and a second testing device receiving data from the electronic device at the first frequency and transmitting data to the electronic device at a second frequency. The second frequency is equal to a product of the first frequency and a frequency offset value.
Claims17
An automatic test equipment device, comprising:
- an input receiving first data from an electronic device at a first frequency, the first frequency corresponding to a reference clock signal, and the first data being a repeatable waveform;
- and
- an output transmitting second data to the electronic device at a second frequency, the second frequency being equal to a product of the first frequency and a frequency offset value, the frequency offset value being equal to a ratio of (i) an integer number of cycles of the repeatable waveform in a sampling window to (ii) a number of data points in the sampling window, and the frequency offset value also being equal to a ratio of (iii) the first frequency to (iv) a sampling frequency of the repeatable waveform used by the automatic test equipment, wherein the automatic test equipment device is configured to coherently sample the repeatable waveform at the sampling frequency over the sampling window.
A method, comprising:
- receiving first data from an electronic device at a first frequency, the first frequency corresponding to a reference clock signal, and the first data being a repeatable waveform;
- sampling the received first data at a sampling frequency over a sampling window;
- and
- transmitting second data to the electronic device at a second frequency, the second frequency being equal to a product of the first frequency and a frequency offset value, the frequency offset value being equal to a ratio of (i) an integer number of cycles of the repeatable waveform in the sampling window to (ii) a number of data points in the sampling window, and the frequency offset value also being equal to a ratio of (iii) the first frequency to (iv) a sampling frequency of the repeatable waveform used by the automatic test equipment.
1 more element
A system, comprising:
- an electronic device;
- a first testing device providing a reference clock signal at a first frequency to the electronic device;
- a second testing device receiving first data from the electronic device at the first frequency and transmitting second data to the electronic device at a second frequency, the second frequency being equal to a product of the first frequency and a frequency offset value, the first data being a repeatable waveform, the frequency offset value being equal to a ratio of (i) an integer number of cycles of the repeatable waveform in a sampling window to (ii) a number of data points in the sampling window, and the frequency offset value also being equal to a ratio of (iii) the first frequency to (iv) a sampling frequency of the repeatable waveform used by the automatic test equipment, wherein the second testing device is configured to coherently sample the repeatable waveform at the sampling frequency over the sampling window.
Dependencies are inferred from the claim text.