Shape measuring device and method
AssigneeCanon Kabushiki Kaisha
InventorMahito Negishi
Life of this patent
Estimating the term…
Loading patent…
AssigneeCanon Kabushiki Kaisha
InventorMahito Negishi
Estimating the term…
A device measures a measurement object surface shape, and includes a base to which the measurement object is secured; a slide movable in at least three different directions and secured to the base; a probe holding unit mounted to the slide; and a contact probe resiliently supported by the holding unit so as to be movable with respect to the holding unit. Additional features include a unit measuring the position and posture of the probe with respect to the holding unit; a unit calculating a contact-force vector, which the probe receives from the measurement object, from a measurement result of the measuring unit; and a controlling unit moving the probe along the surface of the measurement object. The controlling unit also controls a position of the holding unit so that a magnitude of the contact-force vector comes closer to a control target value thereof in accordance with the magnitude of the contact-force vector.
A shape measuring device that measures a shape of a surface of a measurement object, the shape measuring device comprising:
A shape measuring device that measures a shape of a surface of a measurement object, the shape measuring device comprising:
A method of measuring a shape of a surface of a measurement object by moving a contact probe, resiliently supported by a probe holding unit that is movable in at least three different directions, along the surface of the measurement object, and by measuring a position of the contact probe, the method comprising the steps of:
Dependencies are inferred from the claim text.