Method and system for determining element voltage selection control values for a storage device

A workstation computer system, comprising:

• a processor for executing program instructions;
• a memory for storing the program instructions;
• and
• an interface to a device tester for testing a storage device under a variety of operating conditions, and wherein the program instructions comprise program instructions for
• performance testing storage cells within a plurality of elements of the storage device,
• determining whether or not a result of the testing indicates that one or more storage cells or other circuits within a particular element have marginal performance or fail at a nominal desired operating voltage for the storage device,
• in response to determining that the result of the testing indicates that the one or more storage cells or other circuits within a particular element have marginal performance or fail at the desired operating voltage, setting a state of a digital control value corresponding to the particular element within a data set, wherein the state of the digital control value selects a higher operating power supply value for the particular element, and
• in response to determining that the result of the testing indicates that the one or more storage cells or other circuits within the particular element do not have marginal performance and do not fail at the desired operating voltage, setting a different state of the corresponding digital control value within the data set.

A computer program product comprising computer-readable storage media encoding program instructions for execution by a processor in a workstation computer system including an interface to a device tester for testing a storage device under a variety of operating conditions, wherein the program instructions comprise program instructions for:

• performance testing storage cells within each of a plurality of elements of the storage device;
• determining whether or not a result of the testing indicates that one or more storage cells or other circuits within a particular element have marginal performance or fail at a nominal desired operating voltage for the storage device;
• in response to determining that the result of the testing indicates that the one or more storage cells or other circuits within a particular element have marginal performance or fail at the desired operating voltage, setting a state of a digital control value corresponding to the particular element within a data set stored within a computer-readable storage of the workstation computer system, wherein the state of the digital control value selects a higher operating power supply value for the particular element;
• and
• in response to determining that the result of the testing indicates that the one or more storage cells or other circuits within the particular element do not have marginal performance and do not fail at the desired operating voltage, setting a different state of the corresponding digital control value within the data set.