Quantizing circuits with variable reference signals
AssigneeMicron Technology, Inc.
InventorR. Jacob Baker
Life of this patent
Estimating the term…
Loading patent…
AssigneeMicron Technology, Inc.
InventorR. Jacob Baker
Estimating the term…
Systems, methods, and devices are disclosed, such as an integrated semiconductor device that may include a data location coupled to an electrical conductor, a delta-sigma modulator coupled to the electrical conductor, a counter coupled to an output of the delta-sigma modulator, and an interfuser coupled to an output of the counter. In some embodiments, the interfuser is configured to receive two or more counts from the counter and read data conveyed by the data location based on the two or more counts.
A device, comprising:
A system comprising:
Dependencies are inferred from the claim text.
Drawings are temporarily unavailable. Open the PDF at USPTO
From the US filing history. Foreign family members aren’t listed.
Auxiliary circuits, e.g. for writing into memory: sensing or reading circuits; Data output circuits
Arrangements for writing information into, or reading information out from, a digital store: sense amplifiers; Associated circuits , e.g. timing…
Delta-sigma modulation: structural details of delta-sigma modulators, e.g. incremental delta-sigma modulators
Having one quantiser only: the quantiser being a single bit one
About 8 months of term left · ends 15 Jun 2027 (estimated)
1. Field of Invention
Embodiments of the present invention relate generally to devices and, more specifically, in a particular embodiment, to quantizing circuits with variable reference signals.
2. Description of Related Art
FIG. 1 illustrates an electronic device in accordance with an embodiment of the present invention;
FIG. 2 illustrates a memory device in accordance with an embodiment of the present invention;
FIG. 3 illustrates a memory array in accordance with an embodiment of the present invention;
Various embodiments of the present invention are described below. In an effort to provide a concise description of these embodiments, not all features of an actual implementation are described in the specification. It should be appreciated that in the development of any such actual implementation, as in any engineering or design project, numerous implementation-specific decisions must be made to achieve the developers' specific goals, such as compliance with system-related and business-related constraints, which may vary from one implementation to another. Moreover, it should be appreciated that such a development effort might be complex and time consuming but would nevertheless be a routine undertaking of design, fabrication, and manufacture for those of ordinary skill having the benefit of this disclosure.
Some of the subsequently described embodiments may address one or more of the problems with conventional sense amplifiers discussed above. Some embodiments include a quantizing circuit configured to detect small differences in voltages and/or currents. As explained below, the quantizing circuit may sample the measured electrical parameter on multiple occasions and filter, e.g., average or sum, the samples to reduce the impact of noise. As a result, in some embodiments, the quantizing circuit may resolve small differences between voltage or current levels in multi-bit memory elements and/or light sensors, which may allow circuit designers to increase the number of bits stored per memory element and/or the sensitivity of an imaging device. Prior to describing these embodiments and their advantages, the environment in which they may operate is described.
FIG. 1 depicts an electronic device 10 that may be fabricated and configured in accordance with one or more of the present embodiments. The illustrated electronic device 10 includes a memory device 12 that, as explained further below, may include multi-bit memory elements and quantizing circuits. Alternatively, or additionally, the electronic device 10 may include an imaging device 13 having the quantizing circuits.