Voltage clamp circuit and semiconductor device, overcurrent protection circuit, voltage measurement probe, voltage measurement device and semiconductor evaluation device respectively using the same

A voltage clamp circuit that transmits a voltage at an input node to an output node when the voltage at said input node is lower than a clamping voltage, and fixes a voltage at said output node to said clamping voltage when the voltage at said input node is higher than said clamping voltage, the voltage clamp circuit comprising:

• a normally-on type field-effect transistor having a negative threshold voltage;
• and
• a resistance element, wherein
• said field-effect transistor includes a drain connected to said input node, a source connected to said output node, and a gate receiving a first reference voltage,
• said resistance element has an electrode on one side connected to said output node and an electrode on another side receiving a second reference voltage, and
• said clamping voltage is a voltage of a sum of an absolute value of the threshold voltage of said field-effect transistor and said first reference voltage.