Method for measuring information transfer limit in transmission electron microscope, and transmission electron microscope using the same

A transmission electron microscope, comprising:

• an electron source;
• a crystal thin film to which an electron beam radiated from the electron source is routed;
• an electron beam deflector disposed on the side of the electron source beyond the crystal thin film in order to change the angle of the electron beam incident on the crystal thin film;
• a specimen tilting system that adjusts the angle of the crystal specimen with respect to the optical axis of the electron microscope;
• an objective lens on which a diffracted electron beam scattered by the crystal thin film falls;
• an aperture system which is disposed on an opposite side of the objective lens relative to the electron source, which selects the diffracted electron beam, and whose position can be varied depending on the angle of the electron beam incident on the crystal thin film;
• and
• an observation device for use in observing a lattice image that results from interference of the selected diffracted wave and other wave and that is formed on an image plane of the objective lens, wherein:
• a crystal thin film whose lattice constants and structure are known is adopted as a specimen to be assessed,
• a contrast of crystal lattice fringes to be observed is measured in order to measure an information transfer limit of the transmission electron microscope,
• an electron beam is routed to the crystal thin film,
• two specific waves of the electron beam that are transmitted or diffracted are selected and used to form a lattice image, and
• while a condition for diffraction of an electron beam caused by the specimen and a condition for selection of the two transmitted or diffracted waves are held intact, the incident angle of the electron beam falling on the crystal thin film is changed in order to check a change in the contrast of formed crystal lattice fringes for the purpose of measuring an information transfer limit, and wherein:
• the incident angle of the electron beam is changed in order to determine the tilt angle α0 of the incident electron beam, at which the contrast of crystal lattice fringes is 1/e under an achromatic condition satisfied by the two selected waves of the electron beam, or an associated wave number uα0=α0/λ,
• a half angle β of a diffraction angle corresponding to a distance ddf between adjoining ones of lattice fringes, or an associated wave number uβ is represented by the equation (5) below:
• u
• β
• =
• 1
• d
• df
• =
• β
• 2
• ⁢
• λ
• (
• 5
• )
• using the equation (5), an information transfer limit dc is provided as the following equation (6):
• d
• c
• =
• λ
• 2
• ⁢
• θ
• 0
• ⁢
• β
• =
• 1
• 2
• ⁢
• u
• θ
• 0
• ⁢
• u
• β
• (
• 6
• )
• where e denotes the base of a natural logarithm and λ denotes the wavelength of the electron beam.

A transmission electron microscope, comprising:

• an electron source;
• a crystal thin film to which an electron beam radiated from the electron source is routed;
• an electron beam deflector disposed on the side of the electron source beyond the crystal thin film in order to change the angle of the electron beam incident on the crystal thin film;
• a specimen tilting system that adjusts the angle of the crystal specimen with respect to the optical axis of the electron microscope;
• an objective lens on which a diffracted electron beam scattered by the crystal thin film falls;
• an aperture system which is disposed on an opposite side of the objective lens relative to the electron source, which selects the diffracted electron beam, and whose position can be varied depending on the angle of the electron beam incident on the crystal thin film;
• and
• an observation device for use in observing a lattice image that results from interference of the selected diffracted wave and other wave and that is formed on an image plane of the objective lens, wherein:
• a crystal thin film whose lattice constants and structure are known is adopted as a specimen to be assessed,
• a contrast of crystal lattice fringes to be observed is measured in order to measure an information transfer limit of the transmission electron microscope,
• an electron beam is routed to the crystal thin film,
• two specific waves of the electron beam that are transmitted or diffracted are selected and used to form a lattice image, and
• while a condition for diffraction of an electron beam caused by the specimen and a condition for selection of the two transmitted or diffracted waves are held intact, the incident angle of the electron beam falling on the crystal thin film is changed in order to check a change in the contrast of formed crystal lattice fringes for the purpose of measuring an information transfer limit, and wherein:
• the incident angle of the electron beam is changed in order to fit the equation (7) below, which is a function encompassing a focal spread Δ that is an indeterminate constant, to a change in the contrast of lattice fringes derived from a change in the tilt angle α of the incident electron beam or in an associated wave number uα=α/λ,
• {tilde over (Φ)}(uθ)=exp(−8π2Δ2λ2uθ2uβ2) (7)
• the focal spread Δ that is an indeterminate constant is thus determined, and
• an information transfer limit dc is provided as the following equation (8):
• d
• c
• =
• πΔλ
• 2
• (
• 8
• )
• where uβ denotes a wave number (1/ddf) relevant to a distance ddf between adjoining ones of lattice fringes employed for measurement, and λ denotes the wavelength of the electron beam.

A transmission electron microscope comprising:

• an electron source generating a electron beam;
• an electron beam deflector between the electron source and a specimen in order to change an angle of the electron beam incident on the specimen;
• a specimen-holding device which supports the specimen and possesses mechanism to tilt the specimen;
• an objective lens on which a diffracted electron beam of the electron beam scattered by a crystal thin film falls;
• an aperture system positioned below the specimen to select specified transmitted or diffracted electron beams;
• an observation device to observe an image on an image plane of the objective lens that results from interference of the selected electron beams;
• and
• a control system which controls the specimen-tilt to keep the angle between the specimen and the electron beam incident to the specimen to be constant, and the aperture position to track the selected electron beams, while the angle of the electron beam incident to the specimen is changed,
• wherein when the specimen is a crystal thin film with known crystal structure and lattice constant, the angle of the electron beam incident on the specimen is changed in order to check a change in a contrast of formed crystal lattice fringes on the image plane for purpose of measuring an information transfer limit.