Plating method and apparatus for controlling deposition on predetermined portions of a workpiece
AssigneeNovellus Systems, Inc.
InventorBulent M. Basol
Life of this patent
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AssigneeNovellus Systems, Inc.
InventorBulent M. Basol
Estimating the term…
The present invention relates to methods and apparatus for plating a conductive material on a workpiece surface in a highly desirable manner. Using a workpiece-surface-influencing device, such as a mask or sweeper, that preferentially contacts the top surface of the workpiece, relative movement between the workpiece and the workpiece-surface-influencing device is established so that an additive in the electrolyte solution disposed on the workpiece and which is adsorbed onto the top surface is removed or otherwise its amount or concentration changed with respect to the additive on the cavity surface of the workpiece. Plating of the conductive material can place prior to, during and after usage of the workpiece-surface-influencing device, particularly after the workpiece surface influencing device no longer contacts any portion of the top surface of the workpiece, to achieve desirable semiconductor structures.
A method of processing a workpiece comprising an upper surface, a field region defined by the upper surface, and a cavity having a depth below the upper surface and having a width, the width being greater than the depth, the method comprising:
A method of processing a workpiece comprising an upper surface, a field region defined by the upper surface, and a cavity having a depth below the upper surface and having a width, the width being greater than the depth, the method comprising:
A method of processing a workpiece comprising an upper surface and a cavity, the cavity having a depth below the upper surface and having a width, the width being greater than the depth, the method comprising:
Dependencies are inferred from the claim text.