Dielectrostrictive sensor for measuring deformation
AssigneeWisconsin Alumni Research Foundation
InventorsYuri Michael Shkel, Ho Young Lee, Yiyan Peng
Life of this patent
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Abstract
An apparatus and method directed to a solid-state capacitance sensor for measuring a strain force on a dielectric including at least one pair of electrostriction sensors each sensor having at least two electrodes and each having a central axis. The central axes are disposed in a common plane and are oriented substantially mutually perpendicularly to one another. Preferably, at least two pairs of sensors, forming a rosette, are provided to facilitate multi-component analysis of a sample having dielectric properties under stress/strain.
Claims24
A solid-state capacitance sensor for measuring deformation of a sample having dielectric properties, the sensor comprising:
- more than two pairs of electrostriction sensors that are shifted about 45 degrees with respect to one another to form a rosette, each sensor having at least two electrodes and each having a central axis, wherein the central axes are disposed in a common plane and are oriented substantially mutually perpendicularly to one another;
- and
- wherein the more than two pairs of electrostriction sensors include at least one pair of dummy sensors, and wherein the dummy sensors are used as a reference in resolving three dimensional components of deformation of the dielectric sample substantially simultaneously in response to a force exerted on the dielectric sample.
A method of sensing a deformation of a sample having dielectric properties, the method comprising:
- providing more than two pairs of electrostriction sensors that are shifted about 45 degrees with respect to one another to form a rosette, each sensor having at least two electrodes and each having a central axis, wherein the central axes are disposed in a common plane and are oriented substantially mutually perpendicularly to one another;
- positioning the sensors adjacent to the dielectric sample having a dielectric property with no mechanical contact between the sensors and the dielectric sample;
- measuring a change in capacitance associated with each sensor simultaneously with each other;
- and
- wherein the more than two pairs of electrostriction sensors include at least one pair of dummy sensors, and wherein the dummy sensors are used as a reference in resolving three dimensional components of deformation of the dielectric sample in response to a force exerted on the dielectric sample.
A solid-state capacitance sensor for measuring deformation of a sample having dielectric properties, the sensor comprising:
- more than two pairs of electrostriction sensors each sensor having at least two electrodes and each having a central axis, wherein the central axes are disposed in a common plane and are oriented substantially mutually perpendicularly to one another;
- wherein the sample is tempered glass and the sensors measure at least one of a group including stress and strain during formation of the glass;
- and
- wherein the more than two pairs of electrostriction sensors include at least one pair of dummy sensors, and wherein the dummy sensors are used as a reference in resolving three dimensional components of deformation of the dielectric sample in response to one or more forces exerted on the dielectric sample.
Dependencies are inferred from the claim text.