Apparatuses and systems for density gauge reference emulation
AssigneeTroxler Electronic Laboratories, Inc.
InventorsRobert Ernest Troxler, Wewage Hiran Linus Dep
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Abstract
Apparatuses and systems for emulating electrical characteristics of a material having a known dielectric constant are disclosed for standardizing and calibrating of electromagnetic devices. The emulator apparatus can include an electrically non-conductive layer having a dielectric constant less than the material dielectric constant and an electrically conductive layer adjacent the non-conductive layer. Artificial dielectrics for emulating the dielectric constant of a material are also disclosed including a substrate matrix having a dielectric constant less than the material dielectric constant and an additive combined with the substrate, the additive having a dielectric constant higher than the material dielectric constant.
Claims31
An emulator apparatus for emulating electrical characteristics of a material having a known dielectric constant, the emulator apparatus comprising:
- (a) an electrically non-conductive layer having a dielectric constant less than the material dielectric constant;
- and
- (b) an electrically conductive layer adjacent the non-conductive layer.
A combination carrying case and emulator apparatus comprising:
- (a) a housing adapted for containing a dielectric sensitive probe, the housing having a base and a cover;
- and
- (b) an emulator apparatus disposed within the housing for emulating electrical characteristics of a material having a known dielectric constant, the emulator apparatus comprising:
- (i) an electrically non-conductive layer having a dielectric constant less than the control material dielectric constant;
- and
- (ii) an electrically conductive layer adjacent the non-conductive layer.
A system for calibration of a dielectric sensitive probe to account for changes in gauge geometry and other factors affecting gauge calibration accuracy, the system comprising:
- (a) a plurality of emulator apparatuses for emulating electrical characteristics of a plurality of materials having different known dielectric constants, wherein each emulator apparatus is associated with one of the plurality of materials and further wherein each emulator apparatus comprises:
- (i) an electrically non-conductive layer having a dielectric constant less than the associated one material dielectric constant;
- and
- (ii) an electrically conductive layer adjacent the non-conductive layer.
A system for calibration of a dielectric sensitive probe to account for changes in gauge geometry and other factors affecting gauge calibration accuracy, the system comprising:
- (a) a first emulator apparatus for emulating electrical characteristics of a first material having a known dielectric constant, the first emulator apparatus comprising:
- (i) an electrically non-conductive layer having a dielectric constant less than the first material dielectric constant;
- and
- (ii) an electrically conductive layer adjacent the non-conductive layer;
- (b) a second emulator apparatus for emulating electrical characteristics of a second material having a known dielectric constant different from the dielectric constant of the first material, the second emulator apparatus comprising:
- (i) an electrically non-conductive layer having a dielectric constant less than the second material dielectric constant;
- and
- (ii) an electrically conductive layer adjacent the non-conductive layer;
- and
- (c) a third emulator apparatus for emulating electrical characteristics of a third material having a known dielectric constant different from the dielectric constants of the first and second materials, the third emulator apparatus comprising:
- (i) an electrically non-conductive layer having a dielectric constant less than the third material dielectric constant;
- and
- (ii) an electrically conductive layer adjacent the non-conductive layer.
Dependencies are inferred from the claim text.