Methods and apparatus for testing a component
AssigneeGeneral Electric Company
InventorsUi Won Suh, Gigi Olive Gambrell, William McKnight, Preeti Pisupati
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Abstract
A method for inspecting a component having a surface profile that includes a local minima and a local maxima. The method includes generating a raw image of a component under test utilizing an eddy current inspection system, decomposing the raw image into a plurality of images wherein each image includes a different frequency component, and reconstructing at least one final image of the component that includes frequency components that are relevant to an eddy current flaw signal.
Claims17
A method for inspecting a component having a surface profile that includes a local minima and a local maxima, said method comprising:
- generating a raw image of a component under test utilizing an eddy current inspection system;
- decomposing the raw image into a plurality of images wherein each image includes a different frequency component;
- storing a priori flaw signal frequency data in a computer, wherein the flaw signal frequency data includes frequency components that correspond to at least one known eddy current flaw signal;
- selecting at least one image of the plurality of images that includes frequency components that correspond to the at least one known eddy current flaw signal based at least partially on the stored a priori flaw signal frequency data;
- and
- reconstructing at least one final image of the component under test by utilizing the at least one selected image.
An eddy current inspection system comprising:
- an eddy current probe;
- and
- a computer coupled to said eddy current probe, said computer configured to:
- generate a raw image of a component under test;
- decompose the raw image into a plurality of images wherein each image includes a different frequency component;
- store a priori flaw signal frequency data, wherein the data includes frequency components that correspond to at least one known eddy current flaw signal;
- select at least one image of the plurality of images that includes frequency components that correspond to the at least one known eddy current flaw signal based at least partially on the stored a priori flaw signal frequency data;
- and
- reconstruct at least one final image of the component under test from by utilizing the at least one selected image.
Dependencies are inferred from the claim text.