Semiconductor device and method of fabricating the same
AssigneeHynix Semiconductor Inc.
InventorTae Su Jang
Life of this patent
Estimating the term…
Abstract
A method of fabricating a semiconductor device includes forming an ion implanted region on a semiconductor substrate in a cell/core region. The semiconductor substrate is selectively etched to form a recess. The recess exposes a boundary of the ion implanted region. The ion implanted region exposed at the bottom of the recess is removed to form an under-cut space in the semiconductor substrate. An insulating film is formed to form a substrate having a silicon-on-insulator (SOI) structure in the cell/core region. The insulating film fills the under-cut space and the recess.
Claims8
A method of forming a semiconductor substrate, the method comprising:
- performing an ion implanting process over a semiconductor substrate in a cell/core region to form an ion implanted region in the cell/core region;
- selectively etching a portion of the semiconductor substrate located at a portion of a boundary of the ion implanted region to form a first recess exposing the ion implanted region;
- removing the ion implanted region using the first recess to form an under-cut space in the substrate;
- forming a first insulating film to fill the under-cut space and the first recess;
- selectively etching a portion of the semiconductor substrate at a portion of a boundary of the first insulating film to form a second recess exposing the first insulating film, wherein the first recess and the second recess are formed in different locations of the semiconductor substrate;
- and
- forming a second insulating film to form a SOI structure in the substrate of the cell/core region, the second insulating film filling the second recess,
- wherein the first insulating film and the second insulating film form a barrier layer that electrically separates a floating body of the SOI structure in the cell/core region from a bulk body in a peripheral region of the semiconductor substrate.
Dependencies are inferred from the claim text.