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US 7,682,071 B2Granted
Measuring apparatus
AssigneesPostech Academy-Industry Foundation, Postech Foundation
InventorsDong-Sik Kim, Sun-Rock Choi
Life of this patent
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Abstract
A measuring apparatus is provided. The measuring apparatus includes i) a point temperature sensor that has a tip and measures a temperature of an object, ii) a laser that heats the tip of the point temperature sensor by emitting a laser beam, iii) an optical member that is located between the laser and the point temperature sensor, iv) a measuring device that detects and measures a signal from the point temperature sensor, and v) a signal generator that supplies a reference signal.
Claims9
A measuring apparatus comprising:
- at least one point temperature sensor that has a tip and measures a temperature of an object;
- a laser that heats the tip of the point temperature sensor by emitting a laser beam;
- an optical member that is located between the laser and the point temperature sensor;
- a measuring device that detects and measures a signal from the point temperature sensor;
- a signal generator that is connected with the measuring device, the signal generator supplying a reference signal to the measuring device;
- and a container for containing the object, the container having a transparent side, wherein the tip of the point temperature sensor contacts the transparent side of the container,
- wherein a side opposite to the side that is contacted by the tip of the point temperature sensor is irradiated with the laser beam, and,
- wherein thermal properties of the object are measured by heating the tip of the point temperature sensor by the laser beam emitted from the laser.
5 more elements
Dependencies are inferred from the claim text.