Base and contour measuring system using the same
AssigneesHONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD., Hon Hai Precision Industry Co., Ltd.
InventorsQing Liu, Jun-Qi Li
Life of this patent
Estimating the term…
Abstract
An exemplary base includes a first elastic element, a second elastic, two first adjustable spacers and two second adjustable spacers. The first elastic element includes two first spaced plates and a first connecting element for connecting the two first spaced plates. The second elastic element includes two second spaced plates and a second connecting element for connecting the two second spaced plates. The first connecting element and the second connecting element are not in a plane. Two first adjustable spacers connect the two first spaced plates and adjust a distance between the two first spaced plates. Two second adjustable spacers connect the two second spaced plates and adjust a distance between the two second spaced plates.
Claims9
A contour measuring system comprising:
- a base having:
- a first elastic element including two first spaced plates and a first connecting element connecting ends of the two first spaced plates at a same side, the two first spaced plates and the first connecting element cooperatively defining a first spacing;
- a second elastic element stacked on the first elastic element, the second elastic element including two second spaced plates and a second connecting element connecting ends of the two second spaced plates at a same side, the two second spaced plates and the second connecting element cooperatively defining a second spacing, wherein the first connecting element and the second connecting element are not in a same plane;
- at least one first adjustable spacer connecting the two first spaced plates of the first elastic element for adjusting a distance between the two first spaced plates;
- and
- at least one second adjustable spacer connecting the two second spaced plates of the second elastic element for adjusting a distance between the two second spaced plates;
- and
- a contour measuring probe disposed on the base, the contour measuring probe having a tip extension for touching a surface of an object.
A contour measuring system comprising:
- a base having:
- a first U-shaped element comprising two first leg portions;
- a second U-shaped element comprising two second leg portions, the second U-shaped element stacked on the first U-shaped element, wherein one of the first leg portions is in contact with one of the second leg portions, and the first U-shaped element and the second U-shaped element face different directions;
- at least one first adjustable spacer connecting the two first leg portions for adjusting a distance between the two first leg portions of the first U-shaped element;
- at least one second adjustable spacer connecting the two second leg portions for adjusting a distance between the two second leg portions of the second U-shaped element;
- and
- a contour measuring probe disposed on the base, the contour measuring probe having a tip extension for touching a surface of an object.
Dependencies are inferred from the claim text.