Measuring system, computing device and computer readable medium having program executing to perform measuring a region-in-object

A region-in-object measuring system comprising:

• a reference object having an object surface frame which is closely contacted with a surface of an object and a film frame which is closely contacted with an X-ray film, the two frames being separated from each other;
• and
• a computing device having:
• an input part which captures two or more of two-dimensional X-ray images obtained by imaging a region-in-object from different directions by means of an X-ray imaging apparatus in a state in which the object surface frame of the reference object is closely contacted with the surface of the object;
• a first computing part which determines a projection scaling factor for an image of the object surface frame based on the size of a predetermined pattern on a plane of the object surface frame and the size of an image of a predetermined pattern in a two-dimensional X-ray image;
• a second computing part which determines a position vector of a specific point on the plane of the object surface frame and a position vector of an image of a specific point on the plane of the object surface frame in the two-dimensional X-ray image;
• a third computing part which determines a position vector of an X-ray source based on the projection scaling factor determined by the first computing part and the position vector of the specific point on the plane of the object surface frame and the position vector of the image of the, specific point on the plane of the object surface frame determined by the second computing part;
• a fourth computing part which determines a position vector of an image of the region-in-object in the two-dimensional X-ray image;
• a fifth computing part which determines a position vector of the region-in-object based on the position vector of the X-ray source determined by the third computing part and the position vector of the image of the region-in-object determined by the fourth computing part;
• and
• a sixth computing part which decides a three-dimensional location of the region-in-object based on two or more of position vectors of the region-in-object determined by the fifth computing part.

A region-in-object measuring system comprising:

• a reference object having an object surface frame which is closely contacted with a surface of an object and a film location reference frame which is a reference of an X-ray film placed at a free location, the two frames being separated from each other;
• and
• a computing device having:
• an input part which captures a two-dimensional X-ray image obtained by imaging a region-in-object by means of an X-ray imaging apparatus in a state in which the object surface frame of the reference object is closely contacted with the surface of the object;
• a first computing part which determines a transformation coefficient for subjecting an image of the film location reference frame on the X-ray film to two- dimensional projection transformation into an image of the film location reference frame on a reference plane, that has to be taken in a state in which the X-ray film is closely contacted with the film location reference frame, and which subjects an image of the object surface frame on the two-dimensional X-ray image to two-dimensional projection transformation into an image of the object surface frame on the reference plane using the transformation coefficient;
• a second computing part which determines a projection scaling factor for the image of the object surface frame based on the size of a predetermined pattern on a plane of the object surface frame reference plane and the size of an image of a predetermined pattern on the reference plane;
• a third computing part which determines a position vector of a specific point on the plane of the object surface frame and a position vector of the specific point on the reference plane;
• a fourth computing part which determines a location of an X-ray source vector based on the projection scaling factor determined by the second computing part and the position vector of a specific point on the plane of the object surface frame and the position vector of an image of the specific point on the reference plane determined by the third computing part;
• a fifth computing part which determines a position vector of an image of the region-in-object on the reference plane;
• and
• a sixth computing part which determines a position vector of the region-in-object based on the location of the X-ray source vector determined by the fourth computing part and the position vector of the image of the region-in-object determined by the fifth computing part, and which decides an orientation of the region-in-object with respect to the location of the image region-in-object.

A region-in-object measuring system comprising:

• a reference object having an object surface frame which is closely contacted with a surface of an object and a film location reference frame which is a reference of an X-ray film placed at a free location, the two frames being separated from each other;
• and
• a computing device having:
• an input part which captures two or more of two-dimensional X-ray images obtained by imaging a region-in-object from different directions by means of an X-ray imaging apparatus in a state in which the object surface frame of the reference object is closely contacted with the surface of the object;
• a first computing part which determines a transformation coefficient for subjecting an image of the film location reference frame on the X-ray film to two-dimensional projection transformation into an image of the film location reference frame on a reference plane, that has to be taken in a state in which the X-ray film is closely contacted with the film location reference frame, and which subjects an image of the object surface frame on the two-dimensional X-ray image to two-dimensional projection transformation into an image of the object surface frame on the reference plane using the transformation coefficient;
• a second computing part which determines a projection scaling factor for the image of the object surface frame based on the size of a predetermined pattern on a plane of the object surface frame and the size of an image of a predetermined pattern on the reference plane;
• a third computing part which determines a position vector of a specific point on the plane of the object surface frame and a position vector of an image of a specific point on the reference plane;
• a fourth computing part which determines a location of an X-ray source vector based on the projection scaling factor determined by the second computing part and the position vector of a specific point on the plane of the object surface frame and the position vector of an image of the specific point on the reference plane determined by the third computing part;
• a fifth computing part which determines a position vector of an image of the region-in-object on the reference plane;
• a sixth computing part which determines a position vector of the region-in-object based on the location of the X-ray source vector determined by the fourth computing part and the position vector of the image of the region-in-object determined by the fifth computing part;
• and
• a seventh computing part which decides a three-dimensional location of the region-in-object based on two or more of position vectors of the region-in- object determined by the sixth computing part.

A computing device for measuring a region-in-object comprising:

• an input part which captures a two-dimensional X-ray image obtained by imaging a region-in-object by means of an X-ray imaging. apparatus in a state in which an object surface frame of a reference object is closely contacted with a surface of the object, the reference object having the object surface frame which is closely contacted with the surface of the object and a film frame which is closely contacted with an X-ray film, and the two frames being separated from each other;
• a first computing part which determines a projection scaling factor for an image of the object surface frame based on the size of a predetermined pattern on a plane of the object surface frame and the size of an image of a predetermined pattern in a two-dimensional X-ray image;
• a second computing part which determines a position vector of a specific point on the plane of the object surface frame and a position vector of an image of a specific point on the plane of the object surface frame in the two-dimensional X-ray image;
• a third computing part which determines a position vector of an X-ray source based on the projection scaling factor determined by the first computing part and the position vector of the specific point on the plane of the object surface frame and the position vector of the image of the specific point on the plane of the object surface frame determined by the second computing part;
• a fourth computing part which determines a position vector of an image of the region-in-object in the two-dimensional X-ray image;
• and
• a fifth computing part which determines a position vector of the region-in- object based on the position vector of the X-ray source determined by the third computing part and the position vector of the image of the region-in-object determined by the fourth computing part, and which decides an orientation of the region-in-object with respect to the image of the region-in-object.

A computing device for measuring a region-in-object comprising:

• an input part which captures two or more two-dimensional X-ray images obtained by imaging a region-in-object from different directions by means of an X-ray imaging apparatus in a state in which an object surface frame of a reference object is closely contacted with a surface of the object, the reference object having the object surface frame which is closely contacted with the surface of the object and a film frame which is closely contacted with an X-ray film, and the two frames being separated from each other;
• a first computing part which determines a projection scaling factor for an image of the object surface frame based on the size of a predetermined pattern on a plane of the object surface frame and the size of an image of a predetermined pattern in a two-dimensional X-ray image;
• a second computing part which determines a position vector of a specific point on the plane of the object surface frame and a position vector of an image of a specific point on the plane of the object surface frame in the two-dimensional X-ray image;
• a third computing part which determines a position vector of an X-ray source based on the projection scaling factor determined by the first computing part and the position vector of the specific point on the plane of the object surface frame and the position vector of the image of the specific point on the plane of the object surface frame determined by the second computing part;
• a fourth computing part which determines a position vector of an image of the region-in-object in the two-dimensional X-ray image;
• a fifth computing part which determines a position vector of the region-in-object based on the position vector of the X-ray source determined by the third computing part and the position vector of the image of the region-in-object determined by the fourth computing part;
• and
• a sixth computing part which decides a three-dimensional location of the region-in-object based on two or more of position vectors of the region-in-object determined by the fifth computing part.

A computing device for measuring a region-in-object comprising:

• an input part which captures a two-dimensional X-ray image obtained by imaging a region-in-object by means of an X-ray imaging apparatus in a state in which an object surface frame of a reference object is closely contacted with a surface of the object, the reference object having the object surface frame which is closely contacted with the surface of the object and a film location reference frame which is a reference of an X-ray film placed at a free location, and the two frames being separated from each other;
• a first computing part which determines a transformation coefficient for subjecting an image of the film location reference frame on the X-ray film to two-dimensional projection transformation into an image of the film location reference frame on a reference plane, that has to be taken in a state in which the X-ray film is closely contacted with the film location reference frame, and which subjects an image of the object surface frame on the two-dimensional X-ray image to two-dimensional projection transformation into an image of the object surface frame on the reference plane using the transformation coefficient;
• a second computing part which determines a projection scaling factor for the image of the object surface frame based on the size of a predetermined pattern on a plane of the object surface frame and the size of an image of a predetermined pattern on the reference plane;
• a third computing part which determines a position vector of a specific point on the plane of the object surface frame and a position vector of an image of the specific point on the reference plane;
• a fourth computing part which determines a location of an X-ray source vector based on the projection scaling factor determined by the second computing part and the position vector of a specific point on the plane of the object surface frame and the position vector of an image of the specific point on the reference plane determined by the third computing part;
• a fifth computing part which determines a position vector of an image of the region-in-object on the reference plane;
• and a sixth computing part which determines a position vector of the region-in- object based on the location of the X-ray source vector determined by the fourth computing part and the position vector of the image of the region-in-object determined by the fifth computing part, and which decides an orientation of the region-in-object with respect to the location of the image region-in-object.

A computing device for measuring a region-in-object comprising:

• an input part which captures two or more of a two-dimensional X-ray images obtained by imaging a region-in-object from different directions by means of an X-ray imaging apparatus in a state in which an object surface frame of a reference object is closely contacted with a surface of the object, the reference object having the object surface frame which is closely contacted with the surface of the object and a film location reference frame which is a reference of an X-ray film placed at a free location, and the two frames being separated from each other;
• a first computing part which determines a transformation coefficient for subjecting an image of the film location reference frame on the X-ray film to two-dimensional projection transformation into an image of the film location reference frame on a reference plane, that has to be taken in a state in which the X-ray film is closely contacted with the film location reference frame, and which subjects an image of the object surface frame on the two-dimensional X-ray image to two-dimensional projection transformation into an image of the object surface frame on the reference plane using the transformation coefficient;
• a second computing part which determines a projection scaling factor for the image of the object surface frame based on the size of a predetermined pattern on a plane of the object surface frame and the size of an image of a predetermined pattern on the reference plane;
• a third computing part which determines a position vector of a specific point on the plane of the object surface frame and a position vector of an image of a specific point on the reference plane;
• a fourth computing part which determines a location of an X-ray source vector based on the projection scaling factor determined by the second computing part and the position vector of a specific point on the plane of the object surface frame and the position vector of an image of the specific point on the reference plane determined by the third computing part;
• a fifth computing part which determines a position vector of an image of the region-in-object on the reference plane;
• a sixth computing part which determines a position vector of the region-in- object based on the location of the X-ray source vector determined by the fourth computing part and the position vector of the image of the region-in-object determined by the fifth computing part;
• and
• a seventh computing part which decides a three-dimensional location of the region-in-object based on two or more of position vectors of the region-in-object determined by the sixth computing part.

A computer-readable medium having a program stored thereon for executing a computer to perform measuring region-in-object, comprising:

• step A of accepting an input of a two-dimensional X-ray image obtained by imaging a region-in-object by means of an X-ray imaging apparatus in a state in which an object surface frame of a reference object is closely contacted with a surface of the object, the reference object having the object surface frame which is closely contacted with the surface .of the object and a film frame which is closely contacted with an X-ray film, and the two frames being separated from each other;
• step B of determining a projection scaling factor for an image of the object surface frame based on the size of a predetermined pattern on a plane of the object surface frame and the size of an image of a predetermined pattern in a two-dimensional X-ray image on the reference plane;
• step C of determining a position vector of a specific point on the plane of the object surface frame and a position vector of an image of a specific point on the plane of the object surface frame in the two-dimensional X-ray image;
• step D of determining a position vector of an X-ray source based on the projection scaling factor determined at step B and the position vector of the specific point on the plane of the object surface frame and the position vector of the image of the specific point on the plane of the object surface frame determined at step C;
• step E of determining a position vector of an image of the region-in-object in the two-dimensional X-ray image;
• and
• step F of determining a position vector of the region-in-object based on the position vector of the X-ray source determined at step D and the position vector of the image of the region-in-object determined at step E, and determining an orientation of the region-in-object with respect to the image of the region-in-object.

A computer-readable medium having a program stored thereon for executing a computer to perform measuring region-in-object, comprising:

• step A of accepting an input of two or more two-dimensional X-ray images obtained by imaging a region-in-object from different directions by means of an ray imaging apparatus in a state in which an object surface frame of a reference object is closely contacted with a surface of the object, the reference object having the object surface frame which is closely contacted with the surface of the object and a film frame which is closely contacted with an X-ray film, and the two frames being separated from each other;
• step B of determining a projection scaling factor for an image of the object surface frame based on the size of a predetermined pattern on a plane of the object surface frame and the size of an image of a predetermined pattern in a two-dimensional X-ray image;
• step C of determining a position vector of a specific point on the plane of the object surface frame and a position vector of an image of a specific point on the plane of the object surface frame in the two-dimensional X-ray image;
• step D of determining a position vector of an X-ray source based on the projection scaling factor determined at step B and the position vector of the specific point on the plane of the object surface frame and the position vector of the image of the specific point on the plane of the object surface frame determined at step C;
• step E of determining a position vector of an image of the region-in-object in the two-dimensional X-ray image;
• step F of determining a position vector of the region-in-object based on the position vector of the X-ray source determined at step F and the position vector of the image of the region-in-object determined at step E;
• and
• step G of deciding a three-dimensional location of the region-in-object based on two or more of position vectors of the region-in-object determined at step F.

A computer-readable medium having a program stored thereon for executing a computer to perform measuring region-in-object, comprising:

• step A of accepting an input of a two-dimensional X-ray image obtained by imaging a region-in-object by means of an X-ray imaging apparatus in a state in which an object surface frame of a reference object is closely contacted with a surface of the object, the reference object having the object surface frame which is closely contacted with the surface of the object and a film location reference frame which is a reference of an X-ray film placed at a free location, and the two frames being separated from each other;
• step B of determining a transformation coefficient for subjecting an image of the film location reference frame on the X-ray film to two-dimensional projection transformation into an image of the film location reference frame on a reference plane, that has to be taken in a state in which the X-ray film is closely contacted with the film location reference frame, and which subjects an image of the object surface frame on the two-dimensional X-ray image to two-dimensional projection transformation into an image of the object surface frame on the reference plane using the transformation coefficient;
• step C of determining a projection scaling factor for the image of the object surface frame based on the size of a predetermined pattern on a plane of the object surface frame and the size of an image of a predetermined pattern on the reference plane;
• step ID of determining a position vector of a specific point on the plane of the object surface frame and a position vector of an image of the specific point on the reference plane;
• step E of determining a location of an X-ray source vector based on the projection scaling factor determined at step B and the position vector of a specific point on the plane of the object surface frame and the position vector of an image of the specific point on the reference plane determined at step C;
• step F of determining a position vector of an image of the region-in-object on the reference plane;
• and
• step G of determining a position vector of the region-in-object based on the location of the X-ray source vector determined step E and the position vector of the image of the region-in-object determined at step F, and deciding an orientation of the region-in-object with respect to the location of the image region-in-object.

A computer-readable medium having a program stored thereon for executing a computer to perform measuring region-in-object, comprising:

• step A of accepting an input of two or more of a two-dimensional X-ray images obtained by imaging a region-in-object from different directions by means of an X-ray imaging apparatus in a state in which an object surface frame of a reference object is closely contacted with a surface of the object, the reference object having the object surface frame which is closely contacted with the surface of the object and a film location reference frame which is a reference of an X-ray film placed at a free location, and the two frames being separated from each other;
• step B of determining a transformation coefficient for subjecting an image of the film location reference frame on the X-ray film to two-dimensional projection transformation into an image of the film location reference frame on a reference plane, that has to be taken in a state in which the X-ray film is closely contacted with the film location reference frame, and which subjects an image of the object surface frame on the two-dimensional X-ray image to two-dimensional projection transformation into an image of the object surface frame on the reference plane using the transformation coefficient;
• step C of determining a projection scaling factor for the image of the object surface frame based on the size of a predetermined pattern on a plane of the object surface frame plane and the size of an image of a predetermined pattern on the reference plane;
• step D of determining a position vector of a specific point on the plane of the object surface frame and a position vector of an image of a specific point on the reference plane;
• step E of determining a location of an X-ray source vector based on the projection scaling factor determined at step C and the position vector of a specific point on the plane of the object surface frame and the position vector of an image of the specific point on the reference plane determined at step D;
• step F of determining a position vector of an image of the region-in-object on the reference plane;
• step G of determining a position vector of the region-in-object based on the location of the X-ray source vector determined at step E and the position vector of the image of the region-in-object determined at step F;
• and
• step H of deciding a three-dimensional location of the region-in-object based on two or more of position vectors of the region-in-object determined at step G.