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US 7,680,619 B1Granted
Parallel test architecture
AssigneeKeithley Instruments, LLC
InventorMiao Lei
Life of this patent
Estimating the term…
Abstract
A measurement system for testing a DUT includes a plurality of procedures for performing test functions, each procedure having a phase variable; a task queue where the procedures are entered in the task queue with a sign-up value of the phase variable; and a multiphase task executor that arranges the procedures in the queue in response to the sign-up value. The executor changes the phase variable to an execution value and executes the procedures in the task queue after the phase variable has the execution value.
Claims3
A measurement system for testing a DUT, said system comprising:
- a plurality of computer procedures for performing test functions, each procedure having a phase variable;
- a computer task queue, said procedures being entered in said task queue with a sign-up value of said phase variable;
- a multiphase task executor, said executor arranging said procedures in said queue in response to said sign-up value, changing said phase variable to an execution value and executing said procedures in said task queue after said phase variable has the execution value, wherein said procedures may be executed in parallel.
Dependencies are inferred from the claim text.