Low phase noise testing system utilizing a crystal filter
AssigneeBroadcom Corporation
InventorTimothy F. Scranton
Life of this patent
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Abstract
According to one embodiment, a low phase noise testing system includes a tester providing a high phase noise digital channel output. The low phase noise testing system further includes a crystal filter configured to receive the digital channel output and to pass a narrow frequency range from the digital channel output, whereby the high phase noise digital channel output is converted to a low phase noise clock for use by a device under test. The crystal filter can be, for example, a monolithic crystal filter or a discrete crystal filter.
Claims18
A low phase noise testing system comprising:
- a tester providing a high phase noise digital channel output;
- a crystal filter configured to receive said digital channel output and to pass a narrow frequency range from said digital channel output, whereby said high phase noise digital channel output is converted to a low phase noise clock for use by a device under test.
A low phase noise testing system comprising:
- a tester providing a high phase noise reference clock from a reference clock generator;
- a crystal filter configured to receive said reference clock and to pass a narrow frequency range from said reference clock, whereby said high phase noise reference clock is converted to a low phase noise clock for use by a device under test.
Dependencies are inferred from the claim text.