A substrate inspection method of obtaining a target image by causing a computer of an image processor for processing color images from a color image taking device to execute a program stored on a computer-readable memory medium and taking an image of a target substrate to be inspected, said target image being a color image which is a combination of color data corresponding to a plural n-number of different hues, extracting target component parts from the obtained target image and carrying out a specified inspection, said method comprising:
- a first step of obtaining a reference image from a substrate without having said target component parts thereon;
- a second step of thereafter setting a target area to be inspected at a position corresponding to one of said target component parts on said target image;
- a third step of considering those of said color data corresponding to specified less than n of said different hues and extracting difference both in magnitude and in direction in the degree of intensity of said considered color data relative to said combination of color data corresponding to n different hues between each pixel contained in said target area and a corresponding pixel on said reference image;
- and
- a fourth step of extracting those of said pixels of said target image for which the difference extracted in said third step is greater than a specified threshold value and is in a specified direction and carrying out image processing for said specified inspection on an image area comprised of the extracted pixels;
- each of said first step, said second step, said third step and said fourth step being carried out for each of said target component parts.