Test apparatus and pin electronics card
AssigneeAdvantest Corporation
InventorsNaoki Matsumoto, Takashi Sekino
Life of this patent
Estimating the term…
Abstract
Provided is a test apparatus that tests a DUT, which includes a driver that outputs a test signal to the DUT, a first transmission path that electrically connects the driver and the DUT, a first FET switch provided on the first transmission path to connect or disconnect the driver and the DUT to or from each other, and a capacitance compensator that detects an output signal from the DUT, and charges or discharges a capacitive component of the first FET switch based on the detected output signal.
Claims14
A test apparatus that tests a DUT, comprising:
- a driver that outputs a test signal to the DUT;
- a first transmission path that electrically connects the driver and the DUT;
- a first FET switch provided on the first transmission path to connect or disconnect the driver and the DUT to or from each other;
- a capacitance compensator that detects an output signal from the DUT, and charges or discharges a capacitive component of the first FET switch based on the detected output signal;
- and
- a second transmission path that branches out from a portion of the first transmission path that is between the first FET switch and the DUT, the second transmission path connecting the first transmission path and the capacitance compensator.
A test apparatus that tests a DUT, comprising:
- a comparator that compares a voltage of an output signal from the DUT with a predetermined reference voltage;
- a first transmission path;
- a second transmission path that electrically connects the DUT and the comparator;
- a second FET switch provided on the second transmission path to connect or disconnect the comparator and the DUT to or from each other;
- and
- a capacitance compensator that detects a test signal supplied to the DUT, and charges or discharges a capacitive component of the second FET switch based on the detected test signal,
- wherein the first transmission path branches out from a portion of the second transmission path that is between the second FET switch and the DUT, the first transmission path connecting the second transmission path and the capacitance compensator.
A pin electronics card in a test apparatus that exchanges signals with a DUT tested by the test apparatus, comprising:
- a driver that outputs a test signal to the DUT;
- a first transmission path that electrically connects the driver and the DUT;
- a first FET switch provided on the first transmission path to connect or disconnect the driver and the DUT to or from each other;
- a capacitance compensator that detects an output signal from the DUT, and charges or discharges a capacitive component of the first FET switch based on the detected output signal;
- and
- a second transmission path that branches out from a portion of the first transmission path that is between the first FET switch and the DUT, the second transmission path connecting the first transmission path and the capacitance compensator.
A pin electronics card in a test apparatus that exchanges signals with a DUT tested by the test apparatus, comprising:
- a comparator that compares a voltage of an output signal from the DUT with a predetermined reference voltage;
- a first transmission path;
- a second transmission path that electrically connects the DUT and the comparator;
- a second FET switch provided on the second transmission path to connect or disconnect the comparator and the DUT to or from each other;
- and
- a capacitance compensator that detects a test signal supplied to the DUT, and charges or discharges a capacitive component of the second FET switch based on the detected test signal,
- wherein the first transmission path branches out from a portion of the second transmission path that is between the second FET switch and the DUT, the first transmission path connecting the second transmission path and the capacitance compensator.
Dependencies are inferred from the claim text.