Probe for electrical test and electrical connecting apparatus using it
AssigneeKabushiki Kaisha Nihon Micronics
InventorsShinji Kuniyoshi, Hideki Hirakawa, Akira Soma, Takayuki Hayashizaki
Life of this patent
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Abstract
A probe includes an arm region extending in the back and forth direction, and a tip region extending downward from the front end portion of the arm region. The tip region has a pedestal portion integrally continuous to a lower edge portion at the front end side of the arm region and having an underside inclined to an imaginary axis extending in the vertical direction; and a contact portion projected from the underside of the pedestal portion and having a tip orthogonal to an imaginary axis. Thus, the position of the tip can be accurately determined.
Claims7
A probe for electrical test comprising an arm region extending in a back and forth direction, and a tip region extending downward from the front end portion of said arm region;
- wherein said tip region is provided with a pedestal portion integrally continuous to a lower edge portion at a front end side of said arm region, the pedestal portion having a first exposed underside plane inclined to an imaginary axis extending in the vertical direction and a second exposed underside plane inclined to the imaginary axis, the first and second exposed underside planes meeting at a vertex, and said tip region having a contact portion projected from the vertex, the contact portion having first and second exposed sidewalls terminating at the first and second exposed underside planes and inclined at an angle to the imaginary axis, and said contact portion having a tip surface orthogonal to the imaginary axis.
A probe for electrical testing of an integrated circuit, the probe comprising:
- an arm region extending in a back and forth direction, the arm region corresponding to a horizontal reference plane;
- a pedestal portion extending downward from the arm region in a vertical direction, the pedestal portion having a first exposed underside plane inclined relative to the horizontal reference plane, and the pedestal portion having a second exposed underside plane inclined relative to the horizontal reference plane, the first and second exposed underside planes meeting at a vertex that is located below the arm region in the vertical direction;
- and
- a tip contact portion projected from the vertex, the tip contact portion having first and second exposed sidewalls terminating at the first and second exposed underside planes and inclined relative to the horizontal reference plane, the tip contact portion having a tip surface orthogonal to the vertical direction, and the tip contact portion being located below the vertex in the vertical direction;
- wherein the first and second exposed underside planes are arranged to reflect light, which is originally oriented toward the tip contact portion along the vertical direction, in directions that are inclined relative to the vertical direction.
Dependencies are inferred from the claim text.