Test apparatus

A device interface apparatus connected to a test head of a testing apparatus, the device interface apparatus relaying a connection between the test head and a device under test, the device interface apparatus comprising:

• a first switch that opens and closes a connection between a driver of the test head and a first terminal of the device under test;
• a second switch that opens and closes a connection between the driver of the test head and a second terminal of the device under test;
• a first voltage output section that supplies a predetermined voltage via an open/closure switch to the first terminal of the device under test;
• and
• a second voltage output section that supplies a predetermined voltage via an open/closure switch to the second terminal of the device under test, wherein
• one end of the first switch and one end of the second switch are connected to the driver, the other end of the first switch is connected to the first terminal of the device under test, and the other end of the second switch is connected to the second terminal of the device under test.

A testing apparatus for testing a plurality of devices under test, comprising:

• a testing module that includes a test signal generating section that generates a test signal to be supplied to the plurality of devices under test, a driver connected to the test signal generating section that outputs the test signal to supply the test signal to the device under test, and an evaluating section that evaluates the output signal from the device under test;
• and
• a device interface that relays a connection between the plurality of devices under test and the testing module in a manner such that the plurality of devices under test shares at least one of the test signal generating section, the driver, and the evaluating section,
• wherein, in a case where the test signal is not supplied to the devices under test from the driver, the device interface further includes a reference voltage output section for supplying to the plurality of devices under test a reference voltage for keeping the devices under test stabilized and relays the connection in a manner such that the plurality of devices under test share the reference voltage output section.