Void-free damascene copper deposition process and means of monitoring thereof
AssigneeInternational Business Machines Corporation
InventorsPanayotis Andricacos, Dean S. Chung, Hariklia Deligianni, James E. Fluegel, Keith T. Kwietniak, Peter S. Locke, Darryl D. Restaino, Soon-Cheon Seo, Philippe M. Vereecken, Erick G. Walton
Life of this patent
Estimating the term…