Wet etch suitable for creating square cuts in si
AssigneeMicron Technology, Inc.
InventorsWhonchee Lee, Janos Fucsko, David H. Wells
Life of this patent
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Abstract
A single crystal silicon etching method includes providing a single crystal silicon substrate having at least one trench therein. The substrate is exposed to a buffered fluoride etch solution which undercuts the silicon to provide lateral shelves when patterned in the <100> direction. The resulting structure includes an undercut feature when patterned in the <100> direction.
Claims29
A method of creating a square undercut in single crystal silicon, the method comprising:
- patterning single crystal silicon in the <100> direction to form at least one trench therein;
- forming a structure over unrecessed portions of an upper surface of the single crystal silicon and sidewalls of the at least one trench, while leaving a portion of the single crystal silicon exposed within the at least one trench;
- and
- contacting the exposed portion of single crystal silicon within the at least one trench with a solution comprising a fluoride component, an oxidizing agent and an inorganic acid to form at least one undercut defined by concave square corners within the single crystal silicon.
A method of creating a lateral shelf in single crystal silicon, the method comprising:
- aligning a mask on a single crystal silicon along the <110> direction, the mask having at least one opening therein;
- exposing the single crystal silicon to an isotropic etchant through the at least one opening in the mask to form at least one trench in the <100> direction therein;
- forming a structure over unrecessed portions of an upper surface of the single crystal silicon and sidewalls of the at least one trench, while leaving a portion of the single crystal silicon exposed within the at least one trench;
- and
- contacting the exposed portion of single crystal silicon at a bottom of the at least one trench with a solution comprising a fluoride component, an oxidizing agent and an inorganic acid to form at least one square undercut without beveled edges.
A method of etching a single crystal silicon wafer, the method comprising:
- etching the single crystal silicon wafer to form at least one trench in the <100> direction;
- forming a structure over unrecessed portions of an upper surface of the single crystal silicon and sidewalls of the at least one trench, while leaving a bottom of the at least one trench exposed;
- and
- contacting an exposed portion of the single crystal silicon wafer at the bottom of the at least one trench with a solution that etches the (110) and (111) planes of the single crystal silicon faster than the (100) plane of the single crystal silicon
- the solution comprising a fluoride component, an oxidizing component and an inorganic acid to form an undercut cavity defined by concave square corners.
A method of creating a lateral shelf in single crystal silicon, comprising:
- aligning a mask on a single crystal silicon along the <110> direction, the mask having at least one opening therein;
- exposing the single crystal silicon to an anisotropic etchant through the at least one opening in the mask to form at least one trench in the 100> direction therein;
- forming a structure over unrecessed portions of an upper surface of the single crystal silicon and sidewalls of the at least one trench, while leaving a bottom of the at least one trench exposed;
- and
- contacting the exposed single crystal silicon at the bottom of the trench with a solution comprising a fluoride component, an oxidizing agent and an inorganic acid, while the sidewalls of the trench remain substantially covered by the structure, to form an undercut cavity having square corners.
Dependencies are inferred from the claim text.