Testing method for permanent electrical removal of an integrated circuit output
AssigneeMicron Technology, Inc.
InventorAlan R. Wheeler
Life of this patent
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Abstract
An apparatus and method of disconnecting or disabling an input/output terminal of an integrated circuit after packaging. Each input/output terminal of the integrated circuit includes a disabling device coupled thereto between the input/output terminal and the output driver of the respective input/output terminal. A DRAM module is disclosed having a plurality of partially good DRAM devices wherein the known bad input/output terminals are permanently disconnected using a disabling device, both the known good and known bad input/output terminals being coupled to conductive traces of a carrier substrate.
Claims16
An integrated circuit package interface, comprising:
- at least one I/O terminal;
- and
- a corresponding at least one disconnect element configured to selectively couple the at least one I/O terminal to an output driver of an integrated circuit according to a determination of at least partial functionality of the integrated circuit.
An integrated circuit package, comprising:
- an integrated circuit including at least one output driver;
- and
- at least one interface electrically coupled to the at least one output, driver the at least one interface including:
- at least one I/O terminal;
- and
- a corresponding at least one disconnect element configured to selectively couple the at least one I/O terminal to the at least one output driver according to a determination of at least partial functionality of the integrated circuit.
A method of isolating an interface, comprising:
- testing an integrated circuit to determine functionality of the integrated circuit at an output driver;
- and
- isolating the output driver of the integrated circuit from an I/O terminal of an integrated circuit package when the integrated circuit at the output driver is determined as non-functional.
Dependencies are inferred from the claim text.