Method for accessing memory by way of step-increasing threshold voltage
AssigneeMacronix International Co., Ltd.
InventorsChun-Hsiung Hung, Wen-Chiao Ho, Kuen-Long Chang
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AssigneeMacronix International Co., Ltd.
InventorsChun-Hsiung Hung, Wen-Chiao Ho, Kuen-Long Chang
Estimating the term…
A method for accessing memory is provided. The memory includes many multi-level cells each having at least a storage capable of storing 2n bits, n is a positive integer. The method for accessing memory includes the following steps: Firstly, threshold voltages of the storage are defined into 2n level respectively, wherein each of the 2n level corresponds to a storage status of n bits, and most significant bits of the storage statuses which level 0 to level 2n/2−1 correspond to are different from most significant bits of the storage statuses which level 2n/2 to level 2n−1 correspond to. Next, a target data is divided into n portions and the divided target data is written into n temporary memories respectively. Then, n bits of the target data are written into the multi-level cell. Each of the n bits data is collected from each of the n temporary memories.
A method for accessing a memory, wherein the memory comprises a plurality of memory cells, the distribution of threshold voltages at each memory cell comprises level 0˜level 3 from low to high in order, the method for accessing memory comprises:
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