Phase-change random access memory and programming method
AssigneeSamsung Electronics Co., Ltd.
InventorsDong-Seok Suh, Eun-Hong Lee, Jin-Seo Noh
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Abstract
A programming method for a phase-change random access memory (PRAM) may be provided. The programming method may include determining an amorphous state of a chalcogenide material using programming pulses to form programming areas having threshold voltages corresponding to logic high and logic low, and/or controlling a trailing edge of programming pulses during programming to control a quenching speed of the chalcogenide material so as to adjust a threshold voltage of the chalcogenide material. Accordingly, programming pulses corresponding to logic low or logic high may have uniform magnitudes regardless of a corresponding logic level. Accordingly, reliability of a PRAM device may be improved.
Claims13
A programming method for a phase-change random access memory (PRAM), comprising:
- determining an amorphous state of a chalcogenide material using programming pulses to form programming areas having threshold voltages corresponding to logic high and logic low;
- and
- controlling a trailing edge of the programming pulses to control a quenching speed of the chalcogenide material so as to adjust a threshold voltage of the chalcogenide material.
Dependencies are inferred from the claim text.