Method of operating memory cell providing internal power switching
AssigneeSun Microsystems, Inc.
InventorYolin Lih
Life of this patent
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AssigneeSun Microsystems, Inc.
InventorYolin Lih
Estimating the term…
Various implementations are provided that may be used to improve the writeability of individual memory cells providing internal power switching. For example, in one implementation, a method is provided for operating a memory device including a first static random access memory (SRAM) cell including first and second cross-coupled logic gates. The method includes providing a first power level to the first and second cross-coupled logic gates during a read operation performed on the first SRAM cell, and receiving a logic signal at the first SRAM cell. The method also includes switching within the first SRAM cell from providing the first power level to the cross-coupled logic gates to providing a second power level to the cross-coupled logic gates in response to the logic signal to facilitate writing a first logic state into the first SRAM cell.
A method of operating a memory device comprising a first static random access memory (SRAM) cell comprising first and second cross-coupled logic gates, the method comprising:
A method of operating a memory device comprising a first static random access memory (SRAM) cell comprising first and second cross-coupled logic gates, the method comprising:
Dependencies are inferred from the claim text.