Transistor overcurrent detection circuit with improved response time
AssigneeTexas Instruments Incorporated
InventorsCetin Kaya, James Teng, Claus Neesgaard
Life of this patent
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AssigneeTexas Instruments Incorporated
InventorsCetin Kaya, James Teng, Claus Neesgaard
Estimating the term…
A circuit and method for determining overcurrent in a FET detects an output voltage of the FET in both a positive and negative polarity. The related positive or negative currents through the FET can be measured to determine whether an overcurrent condition exists. By measuring positive and negative currents in the FET, the overcurrent detector can obtain twice as much information as when measuring a positive current alone, and can respond more readily to overcurrent conditions. The overcurrent detector avoids the constraints typically observed in cycle-by-cycle PWM control with single polarity Vds sensing, while permitting a relaxation in the timing requirements for current sensing. A spike suppression circuit also contributes to longer sensing intervals.
An apparatus comprising:
An apparatus comprising:
Dependencies are inferred from the claim text.