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US 7,624,316 B2Granted
Apparatus and method for testing removable flash memory devices
AssigneeIntel Corporation
InventorMickey L. Fandrich
Life of this patent
Estimating the term…
Abstract
A memory device may include a controller and a plurality of flash memory dice. The controller is provided for read and write access and communications with a host. However, the controller may also be utilized to test one or more of the flash memory dice mounted on the device. In this way, testing may be achieved with a relatively modestly priced tester by making use of the capabilities of the onboard controller. As a result, the cost of a memory device may be reduced in some cases.
Claims20
A method comprising:
- using a controller in a device to test a flash memory die in said device;
- and
- forming the device with one already tested flash memory die and at least one untested flash memory die.
An electronic device comprising:
- a substrate;
- a controller mounted on said substrate;
- a first electrically tested flash memory die coupled to said controller;
- and
- a second incompletely tested flash memory die coupled to said controller.
2 more elements
Dependencies are inferred from the claim text.