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US 7,623,982 B2Granted
Method of testing an electronic circuit and apparatus thereof
AssigneeSemicaps Pte Ltd
InventorsChoon Meng Chua, Alfred Cheng Teck Quah, Soon Huat Tan, Lian Ser Koh, Jacob Chee Hong Phang
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Abstract
A method of testing an electronic circuit is provided. The method comprises radiating a laser beam onto the electronic circuit, and determining a plurality of samples of a response signal output by the electronic circuit during the period when the laser beam is radiated. The method further comprises accumulating the plurality of samples to generate a value, and generating a test result based on the value.
Claims25
A method of testing an electronic circuit, comprising:
- radiating a laser beam onto the electronic circuit,
- determining a plurality of samples of a response signal output by the electronic circuit during the period when the laser beam is radiated,
- accumulating the plurality of samples to generate a value, and
- generating a test result based on the value.
1 more element
An apparatus, comprising:
- a laser beam source, wherein the laser beam source radiates a laser beam onto the electronic circuit,
- a control system operable to direct the laser beam source to dwell on a location on the electronic circuit,
- a measuring circuit, wherein the measuring circuit determines a plurality of samples of a response signal output by the electronic circuit during the period when the laser beam is radiated, and
- a signal processor, wherein the signal processor
- accumulates the plurality of samples to generate a value, and
- generates a test result based on the value.
3 more elements
Dependencies are inferred from the claim text.