Nanoscale optical microscope
AssigneeThe Trustees of Boston College
InventorsMichael J. Naughton, Krzysztof J. Kempa, Zhifeng Ren
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Abstract
Nanoscale optical probes for use with nanoscale optical microscopy are disclosed herein. A nanoscale optical probe for use with a near-field scanning optical microscope includes an inner conductor having a top end, a bottom end, and a body; a dielectric material engaging the inner conductor; and an outer conductor engaging the dielectric material, wherein the inner conductor is longer at a tip surface of the probe than the dielectric material and the outer conductor.
Claims20
A nanoscale coaxial optical probe comprising:
- a inner conductor having a top end, a bottom end, and a body;
- a dielectric material engaging the inner conductor;
- and
- an outer conductor engaging the dielectric material,
- wherein the inner conductor is longer at a tip surface of the probe than the dielectric material and the outer conductor;
- and
- wherein a diameter of the inner conductor and a diameter of the outer conductor are smaller than an optical signal wavelength.
A magnifying element for use with a near-field scanning optical microscope comprising:
- a film having a top surface, a bottom surface and a plurality of cylindrical channels;
- and
- an array of nanoscale optical probes converging through the film in the plurality of cylindrical channels, wherein each nanoscale optical probe comprises:
- an inner nanowire having a top end, a bottom end, and a body;
- a dielectric material engaging the inner nanowire;
- and
- an outer metal material engaging the dielectric material,
- wherein each nanowire connects a light-emitting pixel on the top surface of the film with a corresponding light-receiving pixel on the bottom surface of the film.
A nanoscale coaxial optical probe comprising:
- a inner conductor having a top end, a bottom end, and a body;
- a dielectric material engaging the inner conductor;
- and
- an outer conductor engaging the dielectric material,
- wherein the inner conductor is longer at a tip surface of the probe than the dielectric material and the outer conductor;
- and
- wherein the probe converts photons from an optical signal into an electric current through a photovoltaic effect.
Dependencies are inferred from the claim text.