System and methods for x-ray backscatter reverse engineering of structures

A method of interrogating a surface of a structure using an x-ray backscatter system to generate an image of an object obscured behind the surface, the x-ray backscatter system including a mobile base portion, at least a first arm secured to the base at an articulation point, at least one x-ray source, and at least one x-ray detector configured to collect x-rays backscattered from the object, the method comprising:

• a) advancing the system through the structure;
• b) articulating the arm and the x-ray detector about the articulation point, the x-ray detector being positioned on the arm at a location spaced from the articulation point;
• c) articulating a first segment of the arm with respect to a second segment of the arm, the first and second segments being connected by a joint;
• d) generating x-rays from the x-ray source and directing the x-rays toward the surface;
• and
• e) detecting a portion of the x-rays at the x-ray detector after the portion of the x-rays have been backscattered from the object obscured behind the surface.

A method of interrogating a surface of a structure using an x-ray backscatter system to generate an image of an object obscured behind the surface, the x-ray backscatter system including a mobile base portion, at least a first arm secured to the base at an articulation point, at least one x-ray source, and at least one x-ray detector configured to collect x-rays backscattered from the object, the method comprising:

• a) advancing the system through the structure;
• b) articulating the arm and the x-ray detector about the articulation point, the x-ray detector being positioned on the arm at a location spaced from the articulation point;
• c) generating x-rays from the x-ray source and directing the x-rays toward the surface;
• and
• c) detecting a portion of the x-rays at the x-ray detector after the portion of the x-rays have been backscattered from the object obscured behind the surface;
• wherein the arm includes a counterweight at a location spaced from the detector and on an opposite side of the articulation point from the detector.

A method of interrogating a surface of a structure using an x-ray backscatter system to generate an image of an object obscured behind the surface, the x-ray backscatter system including a mobile base portion, at least a first arm secured to the base at an articulation point, at least one x-ray source, and at least one x-ray detector configured to collect x-rays backscattered from the object, the method comprising:

• a) advancing the system through the structure;
• b) articulating the arm, the x-ray detector and the x-ray source about the articulation point, the x-ray detector and the x-ray source being positioned on the arm at locations spaced from the articulation point;
• c) generating x-rays from the x-ray source and directing the x-rays toward the surface;
• and
• d) detecting a portion of the x-rays at the x-ray detector after the portion of the x-rays have been backscattered from the object obscured behind the surface.