Method for scattered radiation correction in X-ray imaging, and X-ray imaging system for this purpose
AssigneeSiemens Aktiengesellschaft
InventorKarl Stierstorfer
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AssigneeSiemens Aktiengesellschaft
InventorKarl Stierstorfer
Estimating the term…
The present invention relates to a method for scattered radiation correction in X-ray imaging, and to an X-ray imaging system for carrying out the method. In the method, measurement signals t from an X-ray detector (9) are digitized and converted to logarithmic form, with these measurement signals t having been obtained by radiation through an examination object (10) by the X-ray detector (9). Correction values which have been obtained from a series development of a logarithm ln(1−s/t) are subtracted from the measurement signals that have been converted to logarithmic form, with this series development being terminated at the earliest after the first order, where s denotes a previously determined scattered radiation signal from radiation passed through the examination object (10). The method and the associated X-ray imaging system allow scattered radiation to be corrected for with increased accuracy, on the basis of measurement signals that had been converted to logarithmic form.
A method for scattered radiation correction in X-ray imaging, comprising:
An X-ray imaging system, comprising:
Dependencies are inferred from the claim text.