US 7,623,246 B2 · Optical sensing devices with SPR sensors based on differential phase interrogation and measuring method using the same

Abstract

Disclosed is an optical sensing device, which comprises a light source emitting a light; a beam splitter; an SPR sensor unit comprising a sensing surface; and a detecting mechanism; and a converting unit converting the first beam and the second beam from the optical device into a two-dimensional interference fringe pattern. From the above-mentioned configuration, an extra phase shift of a detection beam in SPR phase measurement is obtained. The differential measurement approach has shown to achieve a sensitivity figure significantly better than the best result that can be obtained from the prior art in the field of the measurement based on an SPR sensor.

Claims20

Dependent claims

A method of detecting differential phase from a SPR sensor, comprising:

receiving light reflected off an SPR sensor, wherein the light is reflected at least twice by the sensing surface;
obtaining a two-dimensional interference fringe pattern image data of the received light using an image capture device;
and
measuring a differential phase between a p-polarization and an s-polarization of the light through analyzing the two-dimensional interference fringe pattern image data using a data processor.

1 more element

A method of detecting SPR sensor differential phase, comprising:

splitting a beam of light into a first beam and a second beam;
reflecting the second beam to an optical device;
reflecting the first beam off an SPR sensor a first time and a second time and to the optical device;
separating a p-polarization component and an s-polarization component of both the reflected first beam and the reflected second beam;
obtaining a two-dimensional interference fringe pattern of the separated reflected first beam and separated reflected second beam for both the p-polarization component and the s-polarization component;
capturing the interference fringe patterns with an image capture device;
measuring the differential phase between the interference fringe pattern for the p-polarization component and the s-polarization component using a data processor.

4 more elements

Dependencies are inferred from the claim text.

Facts

Application

12/046,359Filed 11 Mar 2008 · division

Priority

8 Jul 2005

Published

US 2008/0304072 A111 Dec 2008

Granted

24 Nov 2009

Term ends

Not estimatedThe source records don’t support an estimate.

Classification3 codes

G01N 21/553
Attenuated total reflection: and using surface plasmons
G01N 21/45
Refractivity; Phase-affecting properties, e.g. optical path length: using interferometric methods; using Schlieren methods
G01N
Investigating or analysing materials by determining their chemical or physical properties

Optical sensing devices with SPR sensors based on differential phase interrogation and measuring method using the same

Life of this patent

Optical sensing devices with SPR sensors based on differential phase interrogation and measuring method using the same

Life of this patent

Abstract

Claims20