US 7,623,237 B1Granted

Sample investigating system

AssigneeJ.A. Woollam Co., Inc.

InventorsMartin M. Liphardt, Thomas E. Tiwald, Blaine D. Johs, Jeffrey S. Hale, Craig M. Herzinger, Steven E. Green, Ping He, Ronald A. Synowicki, John A. Woollam

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Abstract

A spectroscopic system for adjusting spacing between an adjacent source/detector as a unit, and a sample, and a reflecting means for directing an incident beam which reflects from said sample back onto said sample and then into the detector along a locus which is in a plane of incidence that is offset from that of the incident beam, or directly from the reflecting means into the detector, including means for reducing reflections of a beam of electromagnetic from the back of a sample, including methodology of use.

Claims11

Dependent claims

A system for monitoring samples comprising:

a source of spectroscopic electromagnetic radiation;
a means for supporting a sample;
a reflecting means;
a detector of spectroscopic electromagnetic radiation;
and
an intensity controlling filter means;
said source and detector being mounted to a common support and laterally offset from one another, such that in use an incident beam of electromagnetic radiation from said source thereof is caused to approach a sample placed on said means for supporting a sample at an intended angle of incidence along a first locus, reflect from said sample, interact with said reflecting means and proceed along a selection from the group consisting of:
again interact with said sample and re-reflect therefrom at the intended angle of incidence, then proceed along a second locus and enter said detector;
and
proceed along a second locus and enter said detector;
said beam also being optionally caused to pass through said intensity controlling means.

8 more elements

Dependencies are inferred from the claim text.